Tripod Polisher® TEM/SEM Sample Preparation, 590, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

Certificates

Supplier: Electron Microscopy Sciences

About this item

A Tripod Polisher® was designed to prepare accurately micro sizes of TEM and SEM samples.

Limited ion milling
No strong chemicals are used to prepare the specimen
Reduce preferential thinning, radiation damage, and heating of the sample

Used to prepare both plan-view and cross-sections from a variety of sample materials, such as ceramics, composites, metals and, geological specimens. The same sample can be studied with both SEM and TEM and hence reduces sample preparation.

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