2-Propanol VLSI for microelectronic, J.T.Baker®
5373-05
: Avantor
:
- Pk:8 pt US
- Seq:8026
- For Microelectronic Use:= 99.5 %
- Assay (CH₃CHOHCH₃):≥ 99.5 %
- Color (APHA):≤ 10
- Residue after Evaporation:≤ 4 ppm
- Solubility in H₂O:Passes Test
- Water (H₂O)(by Karl Fischer titrn):≤ 0.05 %
- Acidity (µeq/g):≤ 0.2
- Alkalinity (µeq/g):≤ 0.1
- Chloride (Cl):≤ 0.2 ppm
- Phosphate (PO₄):≤ 0.3 ppm
- Trace Impurities - Aluminum (Al):≤ 50.0 ppb
- Arsenic and Antimony (as As):≤ 10.0 ppb
- Trace Impurities - Barium (Ba):≤ 20.0 ppb
- Trace Impurities - Boron (B):≤ 10.0 ppb
- Trace Impurities - Cadmium (Cd):≤ 20.0 ppb
- Trace Impurities - Calcium (Ca):≤ 50.0 ppb
- Trace Impurities - Chromium (Cr):≤ 20.0 ppb
- Trace Impurities - Cobalt (Co):≤ 20 ppb
- Trace Impurities - Copper (Cu):≤ 10.0 ppb
- Trace Impurities - Gallium (Ga):≤ 50 ppb
- Trace Impurities - Germanium (Ge):≤ 50.0 ppb
- Trace Impurities - Gold (Au):≤ 20 ppb
- Heavy Metals (as Pb):≤ 200.0 ppb
- Trace Impurities - Iron (Fe):≤ 50.0 ppb
- Trace Impurities - Lead (Pb):≤ 20.0 ppb
- Trace Impurities - Lithium (Li):≤ 50.0 ppb
- Trace Impurities - Magnesium (Mg):≤ 20 ppb
- Trace Impurities - Manganese (Mn):≤ 20.0 ppb
- Trace Impurities - Nickel (Ni):≤ 10.0 ppb
- Trace Impurities - Potassium (K):≤ 100 ppb
- Trace Impurities - Silicon (Si):≤ 50 ppb
- Trace Impurities - Silver (Ag):≤ 20.0 ppb
- Trace Impurities - Sodium (Na):≤ 100.0 ppb
- Trace Impurities - Strontium (Sr):≤ 20.0 ppb
- Trace Impurities - Tin (Sn):≤ 100 ppb
- Trace Impurities - Titanium (Ti):≤ 20 ppb
- Trace Impurities - Zinc (Zn):≤ 50 ppb
- Particle Count - 0.5 µm and greater:≤ 100 par/ml
- Particle Count - 1.0 µm and greater:≤ 8 par/ml
:
:60.1 g/mol
:13,05228
:82 °C (1013 hPa)
:–89 °C
:0.786 g/cm³ (20 °C)
:12 °C
:Ambient
:200-661-7
:1219
:3,II
:Management of Change (MOC) category = R
:01-2119457558-25
:GHS02
:GHS07
:67-63-0
:(CH₃)₂CHOH
:MFCD00011674