Order Entry
United Kingdom
ContactUsLinkComponent
Sodium hydroxide 50% in aqueous solution, CMOS for microelectronic, J.T.Baker®
Sodium hydroxide 50% in aqueous solution, CMOS for microelectronic, J.T.Baker®
Catalog # 3719-09
Supplier:  Avantor
CAS Number:  
undefined
Sodium hydroxide 50% in aqueous solution, CMOS for microelectronic, J.T.Baker®
Catalog # 3719-09
Supplier:  Avantor
CAS Number:  

Specifications

  • Pk:
    600 lb
  • Seq:
    7350
  • Environmentally Preferable:

Specifications

Specification Test Results

  • For Microelectronic Use:
    50.0 - 52.0 %
  • Protect from air to avoid absorption of carbon dioxide.:
    = 10
  • Store at temperatures above 60°F (15°C):
    = 30 ppm
  • Assay (NaOH) (by acidimetry):
    49.5 - 51.5 %
  • Color (APHA):
    ≤10
  • Insoluble Matter:
    ≤30 ppm
  • Sodium Carbonate (Na₂CO₃):
    ≤0.05 %
  • Ammonium Hydroxide Precipitate:
    ≤0.005 %
  • Chloride (Cl):
    ≤20 ppm
  • Heavy Metals (as Ag):
    ≤2 ppm
  • Nitrogen Compounds (as N):
    ≤1 ppm
  • Phosphate (PO₄):
    ≤1 ppm
  • Trace Impurities - Potassium (K):
    ≤50 ppm
  • ACS - Sulfate (SO₄):
    ≤5 ppm
  • Trace Impurities - Aluminum (Al):
    ≤1000.0 ppb
  • Trace Impurities - Calcium (Ca):
    ≤1500.0 ppb
  • Trace Impurities - Chromium (Cr):
    ≤500.0 ppb
  • Trace Impurities - Copper (Cu):
    ≤100.0 ppb
  • Trace Impurities - Iron (Fe):
    ≤1000.0 ppb
  • Trace Impurities - Lead (Pb):
    ≤300.0 ppb
  • Trace Impurities - Magnesium (Mg):
    ≤500.0 ppb
  • Trace Impurities - Mercury (Hg):
    ≤50 ppb
  • Trace Impurities - Nickel (Ni):
    ≤100.0 ppb
  • Trace Impurities - Silicon (Si):
    ≤2000.0 ppb
  • Trace Impurities - Zinc (Zn):
    ≤300.0 ppb

Specification Test Results

About this item

Synonyms: Caustic soda
 :
 :40 g/mol
Boiling Pt:119…135 °C (1013 hPa)
Melting Pt:9…10 °C
Density:1.53 g/cm³ (20 °C)
Storage Temperature:Ambient
EINECS:215-185-5
UN:1824
ADR:8,II
 :GHS05
CAS Number:1310-73-2
Formula:NaOH
MDL Number:MFCD00003548