Acetone ≥99.5%, CMOS™ for Microelectronic, J.T. Baker®

Danger




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For Microelectronic Use
Assay ((CH₃)₂CO) (by GC, corrected for water) ≥ 99.5 %
Color (APHA) ≤ 10
Residue after Evaporation ≤ 5 ppm
Titrable Acid (µeq/g) ≤ 0.3
Titrable Base (µeq/g) ≤ 0.5
Water (H₂O) ≤ 0.5 %
Solubility in H₂O Passes Test
Chloride (Cl) ≤ 0.2 ppm
Phosphate (PO₄) ≤ 0.05 ppm
Trace Impurities - Aluminum (Al) ≤ 50.0 ppb
Arsenic and Antimony (as As) ≤ 5.0 ppb
Trace Impurities - Barium (Ba) ≤ 20.0 ppb
Trace Impurities - Beryllium (Be) ≤ 10.0 ppb
Trace Impurities - Bismuth (Bi) ≤ 20.0 ppb
Trace Impurities - Boron (B) ≤ 10.0 ppb
Trace Impurities - Cadmium (Cd) ≤ 10.0 ppb
Trace Impurities - Calcium (Ca) ≤ 25.0 ppb
Trace Impurities - Chromium (Cr) ≤ 10.0 ppb
Trace Impurities - Cobalt (Co) ≤ 10.0 ppb
Trace Impurities - Copper (Cu) ≤ 10.0 ppb
Trace Impurities - Gallium (Ga) ≤ 10.0 ppb
Trace Impurities - Germanium (Ge) ≤ 10.0 ppb
Trace Impurities - Gold (Au) ≤ 20 ppb
Trace Impurities - Iron (Fe) ≤ 20.0 ppb
Trace Impurities - Lead (Pb) ≤ 10.0 ppb
Trace Impurities - Lithium (Li) ≤ 10.0 ppb
Trace Impurities - Magnesium (Mg) ≤ 20 ppb
Trace Impurities - Manganese (Mn) ≤ 10.0 ppb
Trace Impurities - Molybdenum (Mo) ≤ 10.0 ppb
Trace Impurities - Nickel (Ni) ≤ 10.0 ppb
Trace Impurities - Niobium (Nb) ≤ 50.0 ppb
Trace Impurities - Potassium (K) ≤ 10.0 ppb
Trace Impurities - Silicon (Si) ≤ 50 ppb
Trace Impurities - Silver (Ag) ≤ 10.0 ppb
Trace Impurities - Sodium (Na) ≤ 10.0 ppb
Trace Impurities - Strontium (Sr) ≤ 10.0 ppb
Trace Impurities - Tantalum (Ta) ≤ 50.0 ppb
Trace Impurities - Thallium (Tl) ≤ 10.0 ppb
Trace Impurities - Tin (Sn) ≤ 20.0 ppb
Trace Impurities - Titanium (Ti) ≤ 10.0 ppb
Trace Impurities - Vanadium (V) ≤ 10.0 ppb
Trace Impurities - Zinc (Zn) ≤ 20.0 ppb
Trace Impurities - Zirconium (Zr) ≤ 10.0 ppb
Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF or equivalent) ≤ 150 par/ml
Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF or equivalent) ≤ 25 par/ml