Toluene, CMOS for microelectronic, J.T.Baker®

Specification Test Results

• For Microelectronic Use:
  = 99.5 %
• Assay (C₆H₅CH₃) (by GC):
  ≥99.5 %
• Color (APHA):
  ≤10
• Acidity (µeq/g):
  ≤0.2
• Residue after Evaporation:
  ≤2.0 ppm
• Water (by KF, coulometric):
  ≤0.03 %
• Substances Darkened by H₂SO₄:
  Passes Test
• Sulfur Compounds (as S):
  ≤0.003 %
• Chloride (Cl):
  ≤2 ppm
• Phosphate (PO₄):
  ≤0.5 ppm
• Trace Impurities - Aluminum (Al):
  ≤20 ppb
• Arsenic and Antimony (as As):
  ≤10.0 ppb
• Trace Impurities - Barium (Ba):
  ≤10.0 ppb
• Trace Impurities - Boron (B):
  ≤20.0 ppb
• Trace Impurities - Cadmium (Cd):
  ≤20.0 ppb
• Trace Impurities - Calcium (Ca):
  ≤100.0 ppb
• Trace Impurities - Chromium (Cr):
  ≤10.0 ppb
• Trace Impurities - Cobalt (Co):
  ≤20 ppb
• Trace Impurities - Copper (Cu):
  ≤20.0 ppb
• Trace Impurities - Gallium (Ga):
  ≤50 ppb
• Trace Impurities - Germanium (Ge):
  ≤50.0 ppb
• Trace Impurities - Gold (Au):
  ≤20 ppb
• Heavy Metals (as Pb):
  ≤500.0 ppb
• Trace Impurities - Iron (Fe):
  ≤20.0 ppb
• Trace Impurities - Lithium (Li):
  ≤20.0 ppb
• Trace Impurities - Magnesium (Mg):
  ≤10.0 ppb
• Trace Impurities - Manganese (Mn):
  ≤10.0 ppb
• Trace Impurities - Nickel (Ni):
  ≤20.0 ppb
• Trace Impurities - Potassium (K):
  ≤50 ppb
• Trace Impurities - Silicon (Si):
  ≤100.0 ppb
• Trace Impurities - Silver (Ag):
  ≤20.0 ppb
• Trace Impurities - Sodium (Na):
  ≤100.0 ppb
• Trace Impurities - Strontium (Sr):
  ≤10.0 ppb
• Trace Impurities - Tin (Sn):
  ≤30.0 ppb
• Trace Impurities - Zinc (Zn):
  ≤20.0 ppb
• Particle Count - 1.0 µm and greater:
  ≤10 par/ml