Acetone, CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
Certificates
About this item
Synonyms: 2-Propanone, DMK, Propanone, Dimethyl ketone
CAS Number:67-64-1
:
Formula:CH₃COCH₃
MDL Number:MFCD00008765
Boiling Pt:56.2 °C (1013 hPa)
Melting Pt:–95.4 °C
Density:0.792 g/cm³ (20 °C)
Molecular Weight:58.08 g/mol
Flash Pt:<–20 °C (closed cup)
Storage Temperature:Ambient
UN:1090
ADR:3 II
Merck Index:13,00067
EINECS:200-662-2
REACH:01-2119471330-49
:GHS02
:GHS07
Specifications
- Environmentally Preferable:
Specifications
Specification Test Results
- For Microelectronic Use:= 99.5 %
- Assay ((CH₃)₂CO) (by GC, corrected for water):≥ 99.5 %
- Color (APHA):≤ 10
- Residue after Evaporation:≤ 5 ppm
- Titrable Acid (µeq/g):≤ 0.3
- Titrable Base (µeq/g):≤ 0.5
- Water (H₂O):≤ 0.5 %
- Solubility in H₂O:Passes Test
- Chloride (Cl):≤ 0.2 ppm
- Phosphate (PO₄):≤ 0.05 ppm
- Trace Impurities - Aluminum (Al):≤ 50.0 ppb
- Arsenic and Antimony (as As):≤ 5.0 ppb
- Trace Impurities - Barium (Ba):≤ 20.0 ppb
- Trace Impurities - Beryllium (Be):≤ 10.0 ppb
- Trace Impurities - Bismuth (Bi):≤ 20.0 ppb
- Trace Impurities - Boron (B):≤ 10.0 ppb
- Trace Impurities - Cadmium (Cd):≤ 10.0 ppb
- Trace Impurities - Calcium (Ca):≤ 25.0 ppb
- Trace Impurities - Chromium (Cr):≤ 10.0 ppb
- Trace Impurities - Cobalt (Co):≤ 10.0 ppb
- Trace Impurities - Copper (Cu):≤ 10.0 ppb
- Trace Impurities - Gallium (Ga):≤ 10.0 ppb
- Trace Impurities - Germanium (Ge):≤ 10.0 ppb
- Trace Impurities - Gold (Au):≤ 20 ppb
- Trace Impurities - Iron (Fe):≤ 20.0 ppb
- Trace Impurities - Lead (Pb):≤ 10.0 ppb
- Trace Impurities - Lithium (Li):≤ 10.0 ppb
- Trace Impurities - Magnesium (Mg):≤ 20 ppb
- Trace Impurities - Manganese (Mn):≤ 10.0 ppb
- Trace Impurities - Molybdenum (Mo):≤ 10.0 ppb
- Trace Impurities - Nickel (Ni):≤ 10.0 ppb
- Trace Impurities - Niobium (Nb):≤ 50.0 ppb
- Trace Impurities - Potassium (K):≤ 10.0 ppb
- Trace Impurities - Silicon (Si):≤ 50 ppb
- Trace Impurities - Silver (Ag):≤ 10.0 ppb
- Trace Impurities - Sodium (Na):≤ 10.0 ppb
- Trace Impurities - Strontium (Sr):≤ 10.0 ppb
- Trace Impurities - Tantalum (Ta):≤ 50.0 ppb
- Trace Impurities - Thallium (Tl):≤ 10.0 ppb
- Trace Impurities - Tin (Sn):≤ 20.0 ppb
- Trace Impurities - Titanium (Ti):≤ 10.0 ppb
- Trace Impurities - Vanadium (V):≤ 10.0 ppb
- Trace Impurities - Zinc (Zn):≤ 20.0 ppb
- Trace Impurities - Zirconium (Zr):≤ 10.0 ppb
- Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF or equivalent):≤ 150 par/ml
- Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF or equivalent):≤ 25 par/ml
Specification Test Results
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