For Microelectronic Use:

Recommended Storage Conditions: 15° - 100°F:

Assay (H₂SO₄):

Color (APHA):

Residue after Ignition:

Chloride (Cl):

Nitrate (NO₃):

Phosphate (PO₄):

Trace Impurities - Aluminum (Al):

Arsenic and Antimony (as As):

Trace Impurities - Barium (Ba):

Trace Impurities - Beryllium (Be):

Trace Impurities - Bismuth (Bi):

Trace Impurities - Boron (B):

Trace Impurities - Cadmium (Cd):

Trace Impurities - Calcium (Ca):

Trace Impurities - Chromium (Cr):

Trace Impurities - Cobalt (Co):

Trace Impurities - Copper (Cu):

Trace Impurities - Gallium (Ga):

Trace Impurities - Germanium (Ge):

Trace Impurities - Gold (Au):

Heavy Metals (as Pb):

Trace Impurities - Iron (Fe):

Trace Impurities - Lead (Pb):

Trace Impurities - Lithium (Li):

Trace Impurities - Magnesium (Mg):

Trace Impurities - Manganese (Mn):

Trace Impurities - Mercury (Hg):

Trace Impurities - Molybdenum (Mo):

Trace Impurities - Nickel (Ni):

Trace Impurities - Niobium (Nb):

Trace Impurities - Potassium (K):

Trace Impurities - Silicon (Si):

Trace Impurities - Silver (Ag):

Trace Impurities - Sodium (Na):

Trace Impurities - Strontium (Sr):

Trace Impurities - Tantalum (Ta):

Trace Impurities - Thallium (Tl):

Trace Impurities - Tin (Sn):

Trace Impurities - Titanium (Ti):

Trace Impurities - Vanadium (V):

Trace Impurities - Zinc (Zn):

Trace Impurities - Zirconium (Zr):

Particle Count - 0.5 µm and greater:

Particle Count - 1.0 µm and greater: