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Acetic acid glacial ≥99.7%, CMOS for microelectronic, J.T.Baker®
Acetic acid glacial ≥99.7%, CMOS for microelectronic, J.T.Baker®
Leverantör:  Avantor
Certifikat
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Acetic acid glacial ≥99.7%, CMOS for microelectronic, J.T.Baker®
Leverantör:  Avantor
Certifikat

Specifikationstestresultat

  • For Microelectronic Use:
    = 99.7 %
  • IMPORTANT: Material will freeze if stored below 17 °C (63°F).:
    = 10
  • Assay (CH₃COOH) (by freezing point):
    ≥ 99.7 %
  • Color (APHA):
    ≤ 10
  • Acetic Anhydride ((CH₃CO)₂O):
    ≤ 0.01 %
  • Acetaldehyde:
    ≤ 0.05 %
  • Residue after Evaporation:
    ≤ 4 ppm
  • Solubility in H₂O:
    Passes Test
  • Specific Gravity at 20°/20°C:
    ≥ 1.048
  • Substances Reducing Dichromate:
    Passes Test
  • Substances Reducing Permanganate:
    Passes Test
  • Chloride (Cl):
    ≤ 0.5 ppm
  • Phosphate (PO₄):
    ≤ 0.5 ppm
  • Sulfate (SO₄):
    ≤ 0.5 ppm
  • Trace Impurities - Aluminum (Al):
    ≤ 50.0 ppb
  • Arsenic and Antimony (as As):
    ≤ 5.0 ppb
  • Trace Impurities - Barium (Ba):
    ≤ 10.0 ppb
  • Trace Impurities - Beryllium (Be):
    ≤ 10.0 ppb
  • Trace Impurities - Bismuth (Bi):
    ≤ 50 ppb
  • Trace Impurities - Boron (B):
    ≤ 10.0 ppb
  • Trace Impurities - Cadmium (Cd):
    ≤ 10.0 ppb
  • Trace Impurities - Calcium (Ca):
    ≤ 200.0 ppb
  • Trace Impurities - Chromium (Cr):
    ≤ 30.0 ppb
  • Trace Impurities - Cobalt (Co):
    ≤ 10.0 ppb
  • Trace Impurities - Copper (Cu):
    ≤ 20.0 ppb
  • Trace Impurities - Gallium (Ga):
    ≤ 10.0 ppb
  • Trace Impurities - Germanium (Ge):
    ≤ 10.0 ppb
  • Trace Impurities - Gold (Au):
    ≤ 10.0 ppb
  • Heavy Metals (as Pb):
    ≤ 300.0 ppb
  • Trace Impurities - Iron (Fe):
    ≤ 100.0 ppb
  • Trace Impurities - Lead (Pb):
    ≤ 100 ppb
  • Trace Impurities - Lithium (Li):
    ≤ 10.0 ppb
  • Trace Impurities - Magnesium (Mg):
    ≤ 50.0 ppb
  • Trace Impurities - Manganese (Mn):
    ≤ 10.0 ppb
  • Trace Impurities - Molybdenum (Mo):
    ≤ 10.0 ppb
  • Trace Impurities - Nickel (Ni):
    ≤ 25.0 ppb
  • Trace Impurities - Niobium (Nb):
    ≤ 10.0 ppb
  • Trace Impurities - Potassium (K):
    ≤ 100 ppb
  • Trace Impurities - Silicon (Si):
    ≤ 50 ppb
  • Trace Impurities - Silver (Ag):
    ≤ 10.0 ppb
  • Trace Impurities - Sodium (Na):
    ≤ 100.0 ppb
  • Trace Impurities - Strontium (Sr):
    ≤ 10.0 ppb
  • Trace Impurities - Tantalum (Ta):
    ≤ 10.0 ppb
  • Trace Impurities - Thallium (Tl):
    ≤ 50.0 ppb
  • Trace Impurities - Tin (Sn):
    ≤ 50 ppb
  • Trace Impurities - Titanium (Ti):
    ≤ 100.0 ppb
  • Trace Impurities - Vanadium (V):
    ≤ 10.0 ppb
  • Trace Impurities - Zinc (Zn):
    ≤ 50 ppb
  • Trace Impurities - Zirconium (Zr):
    ≤ 10.0 ppb
  • Particle Count - 1.0 µm and greater:
    ≤ 10 par/ml

Specifikationstestresultat

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