Tripod Polisher® TEM/SEM Sample Preparation, 590, Electron Microscopy Sciences
Product Details & Documents
A Tripod Polisher® was designed to prepare accurately micro sizes of TEM and SEM samples.
- Limited ion milling
- No strong chemicals are used to prepare the specimen
- Reduce preferential thinning, radiation damage, and heating of the sample
Used to prepare both plan-view and cross-sections from a variety of sample materials, such as ceramics, composites, metals and, geological specimens. The same sample can be studied with both SEM and TEM and hence reduces sample preparation.
Specifications
- Description:Plain "L" Bracket
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