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Sulphuric acid 96%, CMOS for microelectronic, J.T.Baker®
Sulphuric acid 96%, CMOS for microelectronic, J.T.Baker®
MOC:  Regulated
Certificates
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Sulphuric acid 96%, CMOS for microelectronic, J.T.Baker®
MOC:  Regulated
Certificates
Restricted Products: To process your orders without delay, please provide the required business documentation to purchase this product.

To order chemicals, medical devices, or other restricted products please provide ID that includes your business name & shipping address via email [email protected] or fax 484.881.5997 referencing your VWR account number. Acceptable forms of ID are:

  • • State issued document with your organization's Federal Tax ID Number
  • • State issued document with your organization's Resale Tax ID Number
  • • City or County issued Business License
  • • State Department of Health Services License
  • • Any other ID issued by the State that includes the business name & address

* ATTN: California Customers may require additional documentation as part of the CA Health & Safety Code. Products that fall under this regulation will be placed on a mandatory 21-day hold after documentation is received. Avantor will not lift restrictions for residential shipping addresses.

Specifications

  • Environmentally Preferable:

Specifications

Specification Test Results

  • Assay (H₂SO₄):
    95.0 - 97.0 %
  • Color (APHA):
    ≤10
  • Residue after Ignition:
    ≤2 ppm
  • Chloride (Cl):
    ≤0.1 ppm
  • Nitrate (NO₃):
    ≤0.2 ppm
  • Phosphate (PO₄):
    ≤0.3 ppm
  • Trace Impurities - Aluminum (Al):
    ≤50.0 ppb
  • Arsenic and Antimony (as As):
    ≤5.0 ppb
  • Trace Impurities - Barium (Ba):
    ≤10.0 ppb
  • Trace Impurities - Beryllium (Be):
    ≤10.0 ppb
  • Trace Impurities - Bismuth (Bi):
    ≤20.0 ppb
  • Trace Impurities - Boron (B):
    ≤10.0 ppb
  • Trace Impurities - Cadmium (Cd):
    ≤10.0 ppb
  • Trace Impurities - Calcium (Ca):
    ≤50.0 ppb
  • Trace Impurities - Chromium (Cr):
    ≤50 ppb
  • Trace Impurities - Cobalt (Co):
    ≤10.0 ppb
  • Trace Impurities - Copper (Cu):
    ≤10.0 ppb
  • Trace Impurities - Gallium (Ga):
    ≤10.0 ppb
  • Trace Impurities - Germanium (Ge):
    ≤10.0 ppb
  • Trace Impurities - Gold (Au):
    ≤20 ppb
  • Heavy Metals (as Pb):
    ≤200.0 ppb
  • Trace Impurities - Iron (Fe):
    ≤100.0 ppb
  • Trace Impurities - Lead (Pb):
    ≤20.0 ppb
  • Trace Impurities - Lithium (Li):
    ≤10.0 ppb
  • Trace Impurities - Magnesium (Mg):
    ≤50.0 ppb
  • Trace Impurities - Manganese (Mn):
    ≤10.0 ppb
  • Trace Impurities - Mercury (Hg):
    ≤5.0 ppb
  • Trace Impurities - Molybdenum (Mo):
    ≤10.0 ppb
  • Trace Impurities - Nickel (Ni):
    ≤10.0 ppb
  • Trace Impurities - Niobium (Nb):
    ≤10.0 ppb
  • Trace Impurities - Potassium (K):
    ≤50 ppb
  • Trace Impurities - Silicon (Si):
    ≤50 ppb
  • Trace Impurities - Silver (Ag):
    ≤10.0 ppb
  • Trace Impurities - Sodium (Na):
    ≤100.0 ppb
  • Trace Impurities - Strontium (Sr):
    ≤10.0 ppb
  • Trace Impurities - Tantalum (Ta):
    ≤10.0 ppb
  • Trace Impurities - Thallium (Tl):
    ≤20.0 ppb
  • Trace Impurities - Tin (Sn):
    ≤50 ppb
  • Trace Impurities - Titanium (Ti):
    ≤10.0 ppb
  • Trace Impurities - Vanadium (V):
    ≤10.0 ppb
  • Trace Impurities - Zinc (Zn):
    ≤50 ppb
  • Trace Impurities - Zirconium (Zr):
    ≤10.0 ppb
  • Particle Count at point of fill - 0.5 µm and greater:
    ≤150 par/ml
  • Particle Count at point of fill - 1.0 µm and greater:
    ≤25 par/ml

Specification Test Results

Related Information