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Orthophosphoric acid ≥85%, CMOS for microelectronic, J.T.Baker®
Catalog # JT0274-11
CAS Number:  
MOC:  RegulatedCertificates
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Orthophosphoric acid ≥85%, CMOS for microelectronic, J.T.Baker®
Catalog # JT0274-11
Supplier Number:  0274-11
CAS Number:  
MOC:  RegulatedCertificates

Specifications

  • Size:
    317.5 L
  • Cat. No.:
    JT0274-11

Specifications

Specification Test Results

  • Assay (H₃PO₄) (by acidimetry):
    85.0 - 87.0 %
  • Color (APHA):
    ≤10
  • Specific Gravity at 60°/60°F:
    1.691 - 1.710
  • Reducing Substances:
    Passes Test
  • Volatile Acids (µeq/g):
    ≤0.16
  • Chloride (Cl):
    ≤1.0 ppm
  • Nitrate (NO₃):
    ≤2 ppm
  • Sulfate (SO₄):
    ≤12 ppm
  • Trace Impurities - Aluminum (Al):
    ≤0.500 ppm
  • Trace Impurities - Antimony (Sb):
    ≤10.000 ppm
  • Trace Impurities - Arsenic (As):
    ≤0.050 ppm
  • Trace Impurities - Calcium (Ca):
    ≤1.500 ppm
  • Trace Impurities - Chromium (Cr):
    ≤0.200 ppm
  • Trace Impurities - Cobalt (Co):
    ≤0.050 ppm
  • Trace Impurities - Copper (Cu):
    ≤0.050 ppm
  • Trace Impurities - Gold (Au):
    ≤0.300 ppm
  • Trace Impurities - ACS - Heavy Metals (as Pb):
    ≤5 ppm
  • Trace Impurities - Iron (Fe):
    ≤2.0 ppm
  • Trace Impurities - Lead (Pb):
    ≤0.300 ppm
  • Trace Impurities - Lithium (Li):
    ≤0.100 ppm
  • Trace Impurities - Magnesium (Mg):
    ≤0.20 ppm
  • Trace Impurities - Manganese (Mn):
    ≤0.100 ppm
  • Trace Impurities - Nickel (Ni):
    ≤0.200 ppm
  • Trace Impurities - Potassium (K):
    ≤1.500 ppm
  • Trace Impurities - Sodium (Na):
    ≤2.500 ppm
  • Trace Impurities - Strontium (Sr):
    ≤0.100 ppm
  • Trace Impurities - Titanium (Ti):
    ≤0.300 ppm
  • Trace Impurities - Zinc (Zn):
    ≤2.000 ppm

Specification Test Results

About this item

 :
 :98 g/mol
Melting Pt:28 °C
Density:1.71 to 1.87 g/cm³ (25 °C)
ADR:8,III
 :Management of Change (MOC) category = R
EINECS:231-633-2
UN:1805
 :GHS05
 :GHS07
Storage Temperature:Ambient
CAS Number:7664-38-2
Formula:H₃PO₄
MDL Number:MFCD00011340