Orthophosphoric acid ≥85%, CMOS for microelectronic, J.T.Baker®
Catalog # JT0274-11
Supplier: AVANTOR PERFORMANCE MATERIALS US
CAS Number:
MOC: RegulatedCertificates
Specifications
- Size:317.5 L
- Cat. No.:JT0274-11
Specifications
Specification Test Results
- Assay (H₃PO₄) (by acidimetry):85.0 - 87.0 %
- Color (APHA):≤10
- Specific Gravity at 60°/60°F:1.691 - 1.710
- Reducing Substances:Passes Test
- Volatile Acids (µeq/g):≤0.16
- Chloride (Cl):≤1.0 ppm
- Nitrate (NO₃):≤2 ppm
- Sulfate (SO₄):≤12 ppm
- Trace Impurities - Aluminum (Al):≤0.500 ppm
- Trace Impurities - Antimony (Sb):≤10.000 ppm
- Trace Impurities - Arsenic (As):≤0.050 ppm
- Trace Impurities - Calcium (Ca):≤1.500 ppm
- Trace Impurities - Chromium (Cr):≤0.200 ppm
- Trace Impurities - Cobalt (Co):≤0.050 ppm
- Trace Impurities - Copper (Cu):≤0.050 ppm
- Trace Impurities - Gold (Au):≤0.300 ppm
- Trace Impurities - ACS - Heavy Metals (as Pb):≤5 ppm
- Trace Impurities - Iron (Fe):≤2.0 ppm
- Trace Impurities - Lead (Pb):≤0.300 ppm
- Trace Impurities - Lithium (Li):≤0.100 ppm
- Trace Impurities - Magnesium (Mg):≤0.20 ppm
- Trace Impurities - Manganese (Mn):≤0.100 ppm
- Trace Impurities - Nickel (Ni):≤0.200 ppm
- Trace Impurities - Potassium (K):≤1.500 ppm
- Trace Impurities - Sodium (Na):≤2.500 ppm
- Trace Impurities - Strontium (Sr):≤0.100 ppm
- Trace Impurities - Titanium (Ti):≤0.300 ppm
- Trace Impurities - Zinc (Zn):≤2.000 ppm
Specification Test Results
About this item
:
:98 g/mol
Melting Pt:28 °C
Density:1.71 to 1.87 g/cm³ (25 °C)
ADR:8,III
:Management of Change (MOC) category = R
EINECS:231-633-2
UN:1805
:GHS05
:GHS07
Storage Temperature:Ambient
CAS Number:7664-38-2
Formula:H₃PO₄
MDL Number:MFCD00011340