



Hydrogen peroxide 30% stabilized, CMOS for microelectronic use, J.T.Baker®
Supplier: AVANTOR PERFORMANCE MATERIALS US
MOC: Regulated
About this item
CAS Number:7722-84-1
:
Formula:H₂O₂
MDL Number:MFCD00011333
Boiling Pt:∼107 °C (1013 hPa)
Melting Pt:<0 °C
Density:1.11 g/cm³ (20 °C)
ADR:5.1,II
:Management of Change (MOC) category = R
:34.01
EINECS:231-765-0
UN:2014
:GHS03
:GHS05
:GHS06
:GHS08
Storage Temperature:Ambient
Some Products May Appear Restricted
To ensure a smooth and speedy checkout, please log in to your account. Some items may show as restricted simply because you're not logged in.
If you do not have an account, you can register using our registration webform (https://www.avantorsciences.com/us/en/login/register)
If you're still seeing restrictions after logging in, certain products—like chemicals or medical devices—require additional account verification steps to be able to place an order. Some items may additionally require a specific license or customer documentation; additional documentation will be requested for these items prior to shipment.
Specification Test Results
- Assay (H₂O₂):30.0 - 32.0 %
- Color (APHA):≤ 10
- Free Acid (µeq/g):≤ 0.2
- Residue after Evaporation:≤ 10 ppm
- Ammonium (NH₄):≤ 3 ppm
- Chloride (Cl):≤ 0.2 ppm
- Nitrate (NO₃):≤ 2 ppm
- Phosphate (PO₄):≤ 1 ppm
- Sulfate (SO₄):≤ 3 ppm
- Trace Impurities - Aluminum (Al):≤ 70.0 ppb
- Arsenic and Antimony (as As):≤ 10.0 ppb
- Trace Impurities - Barium (Ba):≤ 20.0 ppb
- Trace Impurities - Beryllium (Be):≤ 10.0 ppb
- Trace Impurities - Bismuth (Bi):≤ 20.0 ppb
- Trace Impurities - Boron (B):≤ 10.0 ppb
- Trace Impurities - Cadmium (Cd):≤ 10.0 ppb
- Trace Impurities - Calcium (Ca):≤ 50.0 ppb
- Trace Impurities - Chromium (Cr):≤ 20.0 ppb
- Trace Impurities - Cobalt (Co):≤ 10.0 ppb
- Trace Impurities - Copper (Cu):≤ 10.0 ppb
- Trace Impurities - Gallium (Ga):≤ 20.0 ppb
- Trace Impurities - Germanium (Ge):≤ 10.0 ppb
- Trace Impurities - Gold (Au):≤ 10.0 ppb
- Heavy Metals (as Pb):≤ 500.0 ppb
- Trace Impurities - Iron (Fe):≤ 50.0 ppb
- Trace Impurities - Lead (Pb):≤ 10.0 ppb
- Trace Impurities - Lithium (Li):≤ 10.0 ppb
- Trace Impurities - Magnesium (Mg):≤ 10.0 ppb
- Trace Impurities - Manganese (Mn):≤ 10.0 ppb
- Trace Impurities - Molybdenum (Mo):≤ 10.0 ppb
- Trace Impurities - Nickel (Ni):≤ 10.0 ppb
- Trace Impurities - Niobium (Nb):≤ 10.0 ppb
- Trace Impurities - Potassium (K):≤ 600.0 ppb
- Trace Impurities - Silicon (Si):≤ 100.0 ppb
- Trace Impurities - Silver (Ag):≤ 10.0 ppb
- Trace Impurities - Sodium (Na):≤ 100.0 ppb
- Trace Impurities - Strontium (Sr):≤ 10.0 ppb
- Trace Impurities - Tantalum (Ta):≤ 10.0 ppb
- Trace Impurities - Thallium (Tl):≤ 50.0 ppb
- Trace Impurities - Tin (Sn):190.0 - 500.0 ppb
- Trace Impurities - Titanium (Ti):≤ 10.0 ppb
- Trace Impurities - Vanadium (V):≤ 10.0 ppb
- Trace Impurities - Zinc (Zn):≤ 50 ppb
- Trace Impurities - Zirconium (Zr):≤ 10.0 ppb
- Particle Count - 0.2 µm and greater:≤ 1175 par/ml
- Particle Count - 0.5 µm and greater:≤ 100 par/ml
Specification Test Results
Related Information
Certificates
Search by Lot NumberAvantor Portfolio of Chemicals
Product Literature
sds_BAKR2190
SDS
spec_JT2190-3
Product specification
VWR GHS Compliance Letter (US)