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Ammonia solution 29%, CMOS for microelectronic, J.T.Baker®
Corrosive
Irritant
Environment
Ammonia solution 29%, CMOS for microelectronic, J.T.Baker®
Supplier:  AVANTOR PERFORMANCE MATERIALS US
MOC:  Regulated
Certificatesundefined
Corrosive
Irritant
Environment
Ammonia solution 29%, CMOS for microelectronic, J.T.Baker®
Supplier:  AVANTOR PERFORMANCE MATERIALS US
MOC:  Regulated
Certificates

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Specification Test Results

  • Appearance:
    Passes Test
  • Assay (as NH₃):
    28.0 - 30.0 %
  • Color (APHA):
    ≤7
  • Insoluble Matter:
    ≤1 ppm
  • Residue after Ignition:
    ≤3 ppm
  • Carbon Dioxide (CO₂):
    ≤10 ppm
  • Pyridine:
    Passes Test
  • Substances Reducing Permanganate:
    Passes Test
  • Chloride (Cl):
    ≤0.3 ppm
  • Phosphate (PO₄):
    ≤0.20 ppm
  • Total Sulfur (as SO₄):
    ≤0.8 ppm
  • Trace Impurities - Aluminum (Al):
    ≤10.0 ppb
  • Arsenic and Antimony (as As):
    ≤30.0 ppb
  • Trace Impurities - Barium (Ba):
    ≤10.0 ppb
  • Trace Impurities - Beryllium (Be):
    ≤10.0 ppb
  • Trace Impurities - Bismuth (Bi):
    ≤20.0 ppb
  • Trace Impurities - Boron (B):
    ≤10.0 ppb
  • Trace Impurities - Cadmium (Cd):
    ≤5.0 ppb
  • Trace Impurities - Calcium (Ca):
    ≤100.0 ppb
  • Trace Impurities - Chromium (Cr):
    ≤5.0 ppb
  • Trace Impurities - Cobalt (Co):
    ≤1.0 ppb
  • Trace Impurities - Copper (Cu):
    ≤10.0 ppb
  • Trace Impurities - Gallium (Ga):
    ≤10.0 ppb
  • Trace Impurities - Germanium (Ge):
    ≤50.0 ppb
  • Trace Impurities - Gold (Au):
    ≤10.0 ppb
  • Heavy Metals (as Pb):
    ≤200.0 ppb
  • Trace Impurities - Iron (Fe):
    ≤10.0 ppb
  • Trace Impurities - Lead (Pb):
    ≤10.0 ppb
  • Trace Impurities - Lithium (Li):
    ≤10.0 ppb
  • Trace Impurities - Magnesium (Mg):
    ≤50.0 ppb
  • Trace Impurities - Manganese (Mn):
    ≤5.0 ppb
  • Trace Impurities - Molybdenum (Mo):
    ≤10.0 ppb
  • Trace Impurities - Nickel (Ni):
    ≤5.0 ppb
  • Trace Impurities - Niobium (Nb):
    ≤10.0 ppb
  • Trace Impurities - Potassium (K):
    ≤100 ppb
  • Trace Impurities - Silicon (Si):
    ≤150.0 ppb
  • Trace Impurities - Silver (Ag):
    ≤5.0 ppb
  • Trace Impurities - Sodium (Na):
    ≤100.0 ppb
  • Trace Impurities - Strontium (Sr):
    ≤10.0 ppb
  • Trace Impurities - Tantalum (Ta):
    ≤10.0 ppb
  • Trace Impurities - Thallium (Tl):
    ≤20.0 ppb
  • Trace Impurities - Tin (Sn):
    ≤20.0 ppb
  • Trace Impurities - Titanium (Ti):
    ≤10.0 ppb
  • Trace Impurities - Vanadium (V):
    ≤10.0 ppb
  • Trace Impurities - Zinc (Zn):
    ≤5.0 ppb
  • Trace Impurities - Zirconium (Zr):
    ≤10.0 ppb
  • Particle Count at point of fill - 0.5 µm and greater:
    ≤100 par/ml
  • Particle Count at point of fill - 1.0 µm and greater:
    ≤25 par/ml

Specification Test Results

Related Information