The panthera TEC offers high value for the inspection of semiconductors and various other materials, especially in industrial quality control and technical education.

• Smart darkfield with 5 segment illumination mode
• New LD plan achromatic and S-apochromatic BD objectives & 22 mm FOV eyepieces
• Pure incident or incident/ transmitted microscope stands available
• LED color temperature interchangeable
• Motic LightTracer: Coded nosepiece and digital light intensity knob

Brightfield, darkfield and cross polarization contrast are combined with a new, unique-to-Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample. BD models feature LD plan BD objectives with a superb imaging performance, mounted on a 5-fold nosepiece.