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Double FIB Sample and Grid Holder, Electron Microscopy Sciences
Double FIB Sample and Grid Holder, Electron Microscopy Sciences
Catalog # 103306-250
Double FIB Sample and Grid Holder, Electron Microscopy Sciences
Catalog # 103306-250
Supplier Number:  75950-04

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Specifications

  • Description:
    Double FIB Sample and Grid Holder, Pin
  • Dimensions:
    1/2" (12.7 mm)
  • Cat. No.:
    103306-250
  • Supplier no.:
    75950-04

Specifications

About this item

Double FIB sample and grid holder holds sample mounted on two standard pin stubs for FIB milling and lift-out procedures.

  • Vacuum grade aluminum with brass screws
  • Conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging
  • Cost-effective and suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems

Overall dimensions: 36.5 x 12.7 x 11.6 mm (1.44" x 0.5" x 0.46")
Pin: Standard 3.2 mm (1/8")

Delivery: Includes Philips screwdriver.