Model IAM-8 Multi Grid Standard, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
Certificates
About this item
A uniqulye designed standard with four different grid size patterns: 0.5×0.5 mm grid with 25 µm pitch; 1×1 mm grid with 50 µm pitch; 2×2 mm grid with 100 µm pith; and 4×4 mm grid with 200 µm pitch.
- Also includes a star target with 15° increments
- This standard can be used to test not only the overall frame distortion issue, but also linear distances for a wide variety of magnification ranges from 1 to 1000× power
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