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- Description:Reference Stage Graticule Slide
- Size:75×25 mm
- Cat. No.:100496-260
- Supplier no.:68049
This high precision image analysis standard provides four test areas designed for calibrating image analysis systems and identifying deviations and distortions in optical imaging systems.
- Used as a high precision stage micrometer
- Produced on a 75×25 mm slide
- It has a square grid accuracy of ±0.1 µm
- A dot accuracy of ±0.3 µm (except for the smallest and largest two dots on the root-2 array, where accuracy is ±0.5 µm)
The four test areas are:
400×400 µm square grid which is subdivided into 200, 100, 50 and 25 micron squares provides a means of detecting gross image distortions, and can be used as an accurate two dimensional stage micrometer.
A 20×17 array of nominally 15 µm diameter dots can be used to identify lens distortions. i.e. to set the field of view to eliminate edge distortion.
A root-2 array of spots from 3 µm to 48 µm diameter is used for determining the threshold levels of cameras and microscope systems.
A log-normal distribution array of 100 spots ranging from 4.5 µm to 27 µm diameter enables the mean and standard deviation to be determined and compared with the certified values. This is an idealized distribution of maximum dynamic range for a full screen.