A Tripod Polisher® was designed to prepare accurately micro sizes of TEM and SEM samples.
- Limited ion milling
- No strong chemicals are used to prepare the specimen
- Reduce preferential thinning, radiation damage, and heating of the sample
Used to prepare both plan-view and cross-sections from a variety of sample materials, such as ceramics, composites, metals and, geological specimens. The same sample can be studied with both SEM and TEM and hence reduces sample preparation.
Some Products May Appear Restricted
To ensure a smooth and speedy checkout, please log in to your account. Some items may show as restricted simply because you're not logged in.
If you do not have an account, you can register using our registration webform (https://www.avantorsciences.com/us/en/login/register)
If you're still seeing restrictions after logging in, certain products—like chemicals or medical devices—require additional account verification steps to be able to place an order. Some items may additionally require a specific license or customer documentation; additional documentation will be requested for these items prior to shipment.