Color Reference and Spectroscopy Standards
Color reference and spectroscopy standards are used to routinely monitor optical spectrometer mechanisms. The calibration solutions provide the base readings that users can compare with the electromagnetic radiation wavelengths and intensities scientific instruments obtain. Placing the reference solution inside, users can zero out settings to reestablish proper mechanics and eliminate systematic error. For quality control, the color reference and spectroscopy standards guarantee that the machines function properly for accurate spectral lines.
Quality Control Testing Standard, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
Standards Co (Cobalt) is compulsory for checking energy dispersive analyzers.
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MAC Geological/Silicate Material Standards Block, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
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Wavelength and UV Photometric Accuracy Standard, FireFlySci
Supplier: FIREFLYSCI, INC.
Wavelength accuracy is determined by scanning a wavelength filter with sharp, clearly defined transmission peaks and comparing the results to those on the certificate of calibration provided
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NIST 930e VIS Photometric Accuracy Neutral Density Kit, FireflySci
Supplier: FIREFLYSCI, INC.
FireflySci's equivalent of the NIST SRM 930e calibration reference kit for testing photometric accuracy in the VIS range (400 to 700 nm). This kit comes with Firefly's Lifetime Warranty and never requires recalibration.
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Model IAM-MET, Grain Size/Nodularity Analysis Standard, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
The IAM-MET is a multi-morphology calibration standard designed specifically for ASTM.
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UV/VIS Photometric Accuracy Calibration Standards, FUV Dual Series, FireFlySci
Supplier: FIREFLYSCI, INC.
Firefly’s FUV Dual Series filters allow you to verify photometric accuracy and stray light in the range of 200 - 700 nm. Includes certified values for both the front and back of the filter for determining stray light.
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MAC X-ray Microanalysis Individual Standards, Grains, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
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NEFA Linearity Set Solution, Wako
Supplier: Wako Life Sciences
The NEFA Linearity Set is a 2.5 mEq/L solution used to verify the measurable range of the NEFA HR(2) assay.
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MAC X-ray Fluorescence Standards, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
MAC X-ray Microanalysis standards are supplied as 33 m (1/4") diameter pressed pellets or metal foils, and are prepared from selected high purity elements and compounds to ensure interference free-spectra. They are suitable for use by experienced spectroscopists as well as staff training.
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NIST 2031 UV/VIS Photometric Accuracy Kit, FireflySci
Supplier: FIREFLYSCI, INC.
Firefly's upgraded and improved version of the NIST-2031 UV/VIS photometric accuracy kit.
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Customized Multielement X-ray Microanalysis Standards, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
All standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.
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MAC Sulphide Minerals/Oxide Heavy Metals Standards Block, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
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Standard Test Specimen, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
The standard test specimen keeps the scanning electron microscope up to peak operating conditions.
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Cupric Sulfate CS, USP/EP Blue Primary Solution, Ricca Chemical Company
Supplier: Ricca Chemical
USP Colorimetric Solution. (1 mL = 62.4 mg CuSO4*5H2O). Container: Glass.
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MAC Auger Electron Microscopy Standards, Electron Microscopy Sciences
Supplier: Electron Microscopy Sciences
MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES). (Auger electron: one of the electrons ejected from an atom as a result of the internal conversion of its own X-ray in the auger effect. Auger effect: a process in which an atom singly ionized by emitting one electron with energy in the X-ray range instead of emitting the usual X-ray photon on recovery undergoes a transition in which a second electron is emitted).
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MAC X-Ray Microanalysis Individual Standards, Micro-Analysis Consultants
Supplier: Electron Microscopy Sciences
All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.