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106 results for Color Reference and Spectroscopy Standards | Avantor

Color Reference and Spectroscopy Standards

Color Reference and Spectroscopy Standards

Color reference and spectroscopy standards are used to routinely monitor optical spectrometer mechanisms. The calibration solutions provide the base readings that users can compare with the electromagnetic radiation wavelengths and intensities scientific instruments obtain. Placing the reference solution inside, users can zero out settings to reestablish proper mechanics and eliminate systematic error. For quality control, the color reference and spectroscopy standards guarantee that the machines function properly for accurate spectral lines.

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Backscattered Electron Detector Calibration Standard, Electron Microscopy Sciences

Backscattered Electron Detector Calibration Standard, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

This MAC standard checks detector and SEM performance.

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MAC Thin Film Standards for TEM, Electron Microscopy Sciences

MAC Thin Film Standards for TEM, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

These standards are supplied as fine powders that are dispersed onto holey-carbon films and are selected from the range of certified natural and synthetic compounds already in use to prepare bulk analysis standards.

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MAC Thin Foils Standards for STEM, Electron Microscopy Sciences

MAC Thin Foils Standards for STEM, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

Selection of 25 high purity thin foils, 0.1 mm thick, 3 mm Ø to fit into TEM grid holders for use in the STEM mode.

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Traceable Standard for Resolution Calibration, Electron Microscopy Sciences

Traceable Standard for Resolution Calibration, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.

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PS4R Reflected Light Micrometer Scale, Electron Microscopy Sciences

PS4R Reflected Light Micrometer Scale, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

Reflected light calibration slide with 0.1" length scale subdivided into 0.001" divisions.

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NG30 Matthews Spray Droplet Sizing Reticle, Electron Microscopy Sciences

NG30 Matthews Spray Droplet Sizing Reticle, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

Spray droplet sizing reticle for size and distribution assessments of aersol droplets. Used in conjunction with a 40x Microscope for direct measurements of droplets from 50 to 400 μm diameter.

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MAC X-ray Microanalysis Standards for Special Holders, Electron Microscopy Sciences
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MAC X-ray Microanalysis Standards Universal Set, Electron Microscopy Sciences

MAC X-ray Microanalysis Standards Universal Set, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems

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Superband UV/VIS/NIR Photometric Accuracy and Linearity Kit, FireflySci

Superband UV/VIS/NIR Photometric Accuracy and Linearity Kit, FireflySci

Supplier: FIREFLYSCI, INC.

Kit consists of three filters and a blank for validating photometric accuracy and linearity in the range of 200 to 3000 nm.

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MAC X-ray Microanalysis NBS Standards, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. All of our standards are polished to a 0.25 micron diamond finish and carbon coated. They are supplied with fully authenticated certificates of analyses and a location map for standard identification.

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MAC Electron Backscatter Particle Analysis Standard, Electron Microscopy Sciences

MAC Electron Backscatter Particle Analysis Standard, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

Certified standards for system calibration in 13 mm aluminium pin stub.

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X-Checker™, Electron Microscopy Sciences

X-Checker™, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

The X-Checker™ was the first and remains the only complete calibration aid for SEM/EDS Systems.

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NIST 1930 VIS Photometric Accuracy Neutral Density Kit, FireflySci

NIST 1930 VIS Photometric Accuracy Neutral Density Kit, FireflySci

Supplier: FIREFLYSCI, INC.

Firefly's equivalent of the NIST SRM 1930 calibration reference kit for testing photometric accuracy in the VIS range (400 to 700 nm).

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MAC Rare Earth Set for TEM, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

This set consists of 14 rare earth compounds dispersed onto holey carbon films (3.05 mm, 400# copper grid).

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USAF Test Charts, Electron Microscopy Sciences

USAF Test Charts, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences

USAF resolution charts are recognized as a universal standard for testing the vertical and horizontal resolution of imaging systems.

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Wavelength and UV Photometric Accuracy Standard, FireFlySci

Wavelength and UV Photometric Accuracy Standard, FireFlySci

Supplier: FIREFLYSCI, INC.

Wavelength accuracy is determined by scanning a wavelength filter with sharp, clearly defined transmission peaks and comparing the results to those on the certificate of calibration provided

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