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Silicon wafer Type P Test Grade, crystalline, Diameter 100 mm, Thickness 500 µm
Silicon wafer Type P Test Grade, crystalline, Diameter 100 mm, Thickness 500 µm
Catalog # MSPP-452
CAS Number:  
Silicon wafer Type P Test Grade, crystalline, Diameter 100 mm, Thickness 500 µm
Catalog # MSPP-452
Supplier Number:  452
CAS Number:  

Specifications

  • Size:
    100 items
  • Cat. No.:
    MSPP-452
  • Supplier no.:
    452

Specifications

About this item

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