Orthophosphoric acid 85% ≥85%, CMOS for microelectronic, J.T.Baker®

0264-05

:

Orthophosphoric acid 85% ≥85%, CMOS for microelectronic, J.T.Baker®

0264-05

:

Pk:
14 lb
Seq:
7104
Environmentally Preferable:

Assay (H₃PO₄) (by acidimetry) :
85.0 - 87.0 %
Color (APHA) :
≤ 10 5
Specific Gravity at 60°/60°F :
1.691 - 1.710
Reducing Substances:
Passes Test
Volatile Acids (µeq/g) :
≤ 0.16
Chloride (Cl) :
≤ 1 ppm
Nitrate (NO₃):
≤ 2 ppm
Sulfate (SO₄) :
≤ 12 ppm
Trace Impurities - Aluminum (Al) :
≤ 0.500 ppm
Trace Impurities - Antimony (Sb) :
≤ 10.000 ppm
Trace Impurities - Arsenic (As) :
≤ 0.050 ppm
Trace Impurities - Calcium (Ca) :
≤ 1.500 ppm
Trace Impurities - Chromium (Cr) :
≤ 0.200 ppm
Trace Impurities - Cobalt (Co) :
≤ 0.050 ppm
Trace Impurities - Copper (Cu) :
≤ 0.050 ppm
Trace Impurities - Gold (Au) :
≤ 0.300 ppm
Trace Impurities - ACS - Heavy Metals (as Pb) :
≤ 5 ppm
Trace Impurities - Iron (Fe) :
≤ 2.000 ppm
Trace Impurities - Lead (Pb) :
≤ 0.300 ppm
Trace Impurities - Lithium (Li) :
≤ 0.100 ppm
Trace Impurities - Magnesium (Mg) :
≤ 0.20 ppm
Trace Impurities - Manganese (Mn) :
≤ 0.100 ppm
Trace Impurities - Nickel (Ni) :
≤ 0.200 ppm
Trace Impurities - Potassium (K) :
≤ 1.500 ppm
Trace Impurities - Sodium (Na) :
≤ 2.500 ppm
Trace Impurities - Strontium (Sr) :
≤ 0.100 ppm
Trace Impurities - Titanium (Ti) :
≤ 0.300 ppm
Trace Impurities - Zinc (Zn) :
≤ 2.000 ppm
Particle Count - 1.0 µm and greater :
≤ 10 par/ml
Storage Conditions:
Store at temperatures above 22°C (72°F)

: Phosphoric acid

:

:98 g/mol

:28 °C

:1.71…1.87 g/cm³ (25 °C)

:Ambient

:231-633-2

:1805

:8,III

:GHS05

:7664-38-2

:H₃PO₄

:MFCD00011340