Nitric acid ≥70%, CMOS for microelectronic, J.T.Baker®
9606-03
: Avantor
:
- Pack type:Glass bottle, PVC-coated
- Pk:7 lb
- Seq:7068
- Assay (HNO₃}:69.0 - 70.0 %
- Appearance Passes Test:Passes Test
- Color (APHA) :≤10
- Residue after Ignition :≤2 ppm
- Chloride (Cl) :≤0.08 ppm
- Phosphate (PO₄) :≤0.1 ppm
- Sulfate (SO₄) :≤0.2 ppm
- Trace Impurities - Aluminum (Al) :≤40.0 ppb
- Arsenic and Antimony (as As) :≤5 ppb
- Trace Impurities - Barium (Ba) :≤10.0 ppb
- Trace Impurities - Beryllium (Be) :≤10.0 ppb
- Trace Impurities - Bismuth (Bi) :≤20.0 ppb
- Trace Impurities - Boron (B) :≤10.0 ppb
- Trace Impurities - Cadmium (Cd) :≤50.0 ppb
- Trace Impurities - Calcium (Ca) :≤50.0 ppb
- Trace Impurities - Chromium (Cr) :≤30.0 ppb
- Trace Impurities - Cobalt (Co) :≤10.0 ppb
- Trace Impurities - Copper (Cu) :≤10.0 ppb
- Trace Impurities - Gallium (Ga) :≤10.0 ppb
- Trace Impurities - Germanium (Ge) :≤20.0 ppb
- Trace Impurities - Gold (Au) :≤20.0 ppb
- Heavy Metals (as Pb) :≤100 ppb
- Trace Impurities - Iron (Fe) :≤40.0 ppb
- Trace Impurities - Lead (Pb) :≤20.0 ppb
- Trace Impurities - Lithium (Li) :≤10.0 ppb
- Trace Impurities - Magnesium (Mg) :≤20.0 ppb
- Trace Impurities - Manganese (Mn) :≤10.0 ppb
- Trace Impurities - Potassium (K) :≤50.0 ppb
- Trace Impurities - Silicon (Si) :≤50.0 ppb
- Trace Impurities - Silver (Ag) :≤20.0 ppb
- Trace Impurities - Sodium (Na) :≤150.0 ppb
- Trace Impurities - Strontium (Sr) :≤30.0 ppb
- Trace Impurities - Tantalum (Ta) :≤10.0 ppb
- Trace Impurities - Thallium (Tl) :≤10.0 ppb
- Trace Impurities - Tin (Sn) :≤20.0 ppb
- Trace Impurities - Titanium (Ti) :≤10.0 ppb
- Trace Impurities - Vanadium (V) :≤10.0 ppb
- Trace Impurities - Zinc (Zn) :≤20.0 ppb
- Trace Impurities - Zirconium (Zr) :≤10.0 ppb
- Particle Count - 0.5 µm and greater :≤60 par/ml
- Particle Count - 1.0 µm and greater :≤10 par/ml
:
:63.01 g/mol
:Ambient
:231-714-2
:2031
:8,I
:GHS03
:GHS05
:7697-37-2
:HNO₃
:MFCD00011349