Nitric acid 69% VLSI for microelectronic, J.T.Baker®
Catalog # 5371-03
Supplier: Avantor
CAS Number:
Specifications
- Pk:7 lb
- Seq:7068
Specifications
Specification Test Results
- For Microelectronic Use:69.0 - 70.0 %
- Assay (HNO₃):69.0 - 70.0 %
- Appearance:Passes Test
- Color (APHA):≤10
- Chloride (Cl):≤0.08 ppm
- Phosphate (PO₄):≤0.05 ppm
- Sulfate (SO₄):≤0.2 ppm
- Trace Impurities - Aluminum (Al):≤20 ppb
- Arsenic and Antimony (as As):≤3.0 ppb
- Trace Impurities - Barium (Ba):≤10.0 ppb
- Trace Impurities - Bismuth (Bi):≤50 ppb
- Trace Impurities - Boron (B):≤10.0 ppb
- Trace Impurities - Cadmium (Cd):≤5.0 ppb
- Trace Impurities - Calcium (Ca):≤50.0 ppb
- Trace Impurities - Chromium (Cr):≤30.0 ppb
- Trace Impurities - Cobalt (Co):≤5.0 ppb
- Trace Impurities - Copper (Cu):≤5.0 ppb
- Trace Impurities - Gallium (Ga):≤10.0 ppb
- Trace Impurities - Germanium (Ge):≤10.0 ppb
- Trace Impurities - Gold (Au):≤10.0 ppb
- Trace Impurities - Iron (Fe):≤50.0 ppb
- Trace Impurities - Lead (Pb):≤20.0 ppb
- Trace Impurities - Lithium (Li):≤10.0 ppb
- Trace Impurities - Magnesium (Mg):≤30.0 ppb
- Trace Impurities - Manganese (Mn):≤5.0 ppb
- Trace Impurities - Nickel (Ni):≤10.0 ppb
- Trace Impurities - Niobium (Nb):≤50.0 ppb
- Trace Impurities - Potassium (K):≤20.0 ppb
- Trace Impurities - Silicon (Si):≤60.0 ppb
- Trace Impurities - Silver (Ag):≤10.0 ppb
- Trace Impurities - Sodium (Na):≤60.0 ppb
- Trace Impurities - Strontium (Sr):≤10.0 ppb
- Trace Impurities - Tin (Sn):≤10.0 ppb
- Trace Impurities - Titanium (Ti):≤50.0 ppb
- Trace Impurities - Zinc (Zn):≤10.0 ppb
- Particle Count - 0.5 µm and greater:≤90 par/ml
- Particle Count - 1.0 µm and greater:≤10 par/ml
Specification Test Results
About this item
:
:63.01 g/mol
Density:1.4 g/cm³ (20 °C)
Storage Temperature:Ambient
UN:2031
ADR:8,II
:GHS02
:GHS05
:GHS07
CAS Number:7697-37-2
Formula:HNO₃
MDL Number:MFCD00011349