Orthophosphoric acid ≥ 85% ≥85%, CMOS for microelectronic, J.T.Baker®
Catalog # 0274-11
Supplier: Avantor
CAS Number:
Specifications
- Pk:700 lb
- Seq:7365
- Environmentally Preferable:
Specifications
Specification Test Results
- For Microelectronic Use:85.0 - 87.0 %
- Store at temperatures above 22°C (72°F):≤10
- Assay (H₃PO₄) (by acidimetry):85.0 - 87.0 %
- Color (APHA):≤10
- Specific Gravity at 60°/60°F:1.691 - 1.710
- Reducing Substances:Passes Test
- Volatile Acids (µeq/g):≤0.16
- Chloride (Cl):≤1.0 ppm
- Nitrate (NO₃):≤2 ppm
- Sulfate (SO₄):≤12 ppm
- Trace Impurities - Aluminum (Al):≤0.500 ppm
- Trace Impurities - Antimony (Sb):≤10.000 ppm
- Trace Impurities - Arsenic (As):≤0.050 ppm
- Trace Impurities - Calcium (Ca):≤1.500 ppm
- Trace Impurities - Chromium (Cr):≤0.200 ppm
- Trace Impurities - Cobalt (Co):≤0.050 ppm
- Trace Impurities - Copper (Cu):≤0.050 ppm
- Trace Impurities - Gold (Au):≤0.300 ppm
- Trace Impurities - ACS - Heavy Metals (as Pb):≤5 ppm
- Trace Impurities - Iron (Fe):≤2.0 ppm
- Trace Impurities - Lead (Pb):≤0.300 ppm
- Trace Impurities - Lithium (Li):≤0.100 ppm
- Trace Impurities - Magnesium (Mg):≤0.20 ppm
- Trace Impurities - Manganese (Mn):≤0.100 ppm
- Trace Impurities - Nickel (Ni):≤0.200 ppm
- Trace Impurities - Potassium (K):≤1.500 ppm
- Trace Impurities - Sodium (Na):≤2.500 ppm
- Trace Impurities - Strontium (Sr):≤0.100 ppm
- Trace Impurities - Titanium (Ti):≤0.300 ppm
- Trace Impurities - Zinc (Zn):≤2.000 ppm
Specification Test Results
About this item
Synonyms: Phosphoric acid
:
:98 g/mol
Merck Index:14,08596
Boiling Pt:1600 °C (1013 hPa)
Melting Pt:28 °C
Density:1,71…1.87 g/cm³ (25 °C)
Storage Temperature:Ambient
EINECS:231-633-2
UN:1805
ADR:8,III
REACH:01-2119485498-19
:GHS05
:GHS07
CAS Number:7664-38-2
Formula:H₃PO₄
MDL Number:MFCD00011340