Toluene, CMOS for microelectronic, J.T.Baker®
9466-03
: Avantor
:
- Pk:4 L
- Seq:5162
- For Microelectronic Use:= 99.5 %
- Assay (C₆H₅CH₃) (by GC):≥99.5 %
- Color (APHA):≤10
- Acidity (µeq/g):≤0.2
- Residue after Evaporation:≤2.0 ppm
- Water (by KF, coulometric):≤0.03 %
- Substances Darkened by H₂SO₄:Passes Test
- Sulfur Compounds (as S):≤0.003 %
- Chloride (Cl):≤2 ppm
- Phosphate (PO₄):≤0.5 ppm
- Trace Impurities - Aluminum (Al):≤20 ppb
- Arsenic and Antimony (as As):≤10.0 ppb
- Trace Impurities - Barium (Ba):≤10.0 ppb
- Trace Impurities - Boron (B):≤20.0 ppb
- Trace Impurities - Cadmium (Cd):≤20.0 ppb
- Trace Impurities - Calcium (Ca):≤100.0 ppb
- Trace Impurities - Chromium (Cr):≤10.0 ppb
- Trace Impurities - Cobalt (Co):≤20 ppb
- Trace Impurities - Copper (Cu):≤20.0 ppb
- Trace Impurities - Gallium (Ga):≤50 ppb
- Trace Impurities - Germanium (Ge):≤50.0 ppb
- Trace Impurities - Gold (Au):≤20 ppb
- Heavy Metals (as Pb):≤500.0 ppb
- Trace Impurities - Iron (Fe):≤20.0 ppb
- Trace Impurities - Lithium (Li):≤20.0 ppb
- Trace Impurities - Magnesium (Mg):≤10.0 ppb
- Trace Impurities - Manganese (Mn):≤10.0 ppb
- Trace Impurities - Nickel (Ni):≤20.0 ppb
- Trace Impurities - Potassium (K):≤50 ppb
- Trace Impurities - Silicon (Si):≤100.0 ppb
- Trace Impurities - Silver (Ag):≤20.0 ppb
- Trace Impurities - Sodium (Na):≤100.0 ppb
- Trace Impurities - Strontium (Sr):≤10.0 ppb
- Trace Impurities - Tin (Sn):≤30.0 ppb
- Trace Impurities - Zinc (Zn):≤20.0 ppb
- Particle Count - 1.0 µm and greater:≤10 par/ml
:
:92.14 g/mol
:1294
:3,II
:108-88-3
:C₆H₅CH₃
:MFCD00008512