Sulphuric acid ≥ 95% ≥95%, Finyte® for microelectronic, J.T.Baker®
5802-15
: Avantor
:
- Pk:15 lb
- Seq:7038
- Environmentally Preferable:
- For Microelectronic Use:95.0 - 97.0 %
- Recommended Storage Conditions: 15° - 100°F:= 10
- Assay (H₂SO₄):95.0 - 97.0 %
- Color (APHA):≤10
- Chloride (Cl):≤0.1 ppm
- Nitrate (NO₃):≤0.1 ppm
- Phosphate (PO₄):≤0.20 ppm
- Trace Impurities - Aluminum (Al):≤10.0 ppb
- Arsenic and Antimony (as As):≤2.0 ppb
- Trace Impurities - Barium (Ba):≤5.0 ppb
- Trace Impurities - Beryllium (Be):≤1.0 ppb
- Trace Impurities - Bismuth (Bi):≤10.0 ppb
- Trace Impurities - Boron (B):≤10.0 ppb
- Trace Impurities - Cadmium (Cd):≤5.0 ppb
- Trace Impurities - Calcium (Ca):≤10.0 ppb
- Trace Impurities - Chromium (Cr):≤5.0 ppb
- Trace Impurities - Cobalt (Co):≤5.0 ppb
- Trace Impurities - Copper (Cu):≤5.0 ppb
- Trace Impurities - Gallium (Ga):≤10.0 ppb
- Trace Impurities - Germanium (Ge):≤10.0 ppb
- Trace Impurities - Gold (Au):≤5.0 ppb
- Trace Impurities - Iron (Fe):≤10.0 ppb
- Trace Impurities - Lead (Pb):≤10.0 ppb
- Trace Impurities - Lithium (Li):≤5.0 ppb
- Trace Impurities - Magnesium (Mg):≤10.0 ppb
- Trace Impurities - Manganese (Mn):≤5.0 ppb
- Trace Impurities - Molybdenum (Mo):≤5.0 ppb
- Trace Impurities - Nickel (Ni):≤5.0 ppb
- Trace Impurities - Niobium (Nb):≤5.0 ppb
- Trace Impurities - Potassium (K):≤10.0 ppb
- Trace Impurities - Silicon (Si):≤10.0 ppb
- Trace Impurities - Silver (Ag):≤5.0 ppb
- Trace Impurities - Sodium (Na):≤10.0 ppb
- Trace Impurities - Strontium (Sr):≤5.0 ppb
- Trace Impurities - Tantalum (Ta):≤10.0 ppb
- Trace Impurities - Thallium (Tl):≤10.0 ppb
- Trace Impurities - Tin (Sn):≤10.0 ppb
- Trace Impurities - Titanium (Ti):≤5.0 ppb
- Trace Impurities - Vanadium (V):≤5.0 ppb
- Trace Impurities - Zinc (Zn):≤10.0 ppb
- Trace Impurities - Zirconium (Zr):≤10.0 ppb
- Particle Count - 0.5 µm and greater:≤25 par/ml
- Particle Count - 1.0 µm and greater:≤10 par/ml
:
:98.08 g/mol
:1830
:7664-93-9
:H₂SO₄
:MFCD00064589
:330
:10.38
:1.84
:8 II