인화성
자극성
건강 Acetone ≥99.5% (by GC, corrected for water content), CMOS for microelectronic, J.T.Baker®
공급사: Avantor
인증서
이 제품에 관하여
CAS 번호:67-64-1
:
화학식:CH₃COCH₃
MDL 번호:MFCD00008765
:58.08 g/mol
머크 색인:13,00067
끓는점:56,2 °C (1013 hPa)
밀도:0,792 g/cm³ (20 °C)
인화점:<–20 °C (closed cup)
보관 온도:Ambient
EINECS:200-662-2
UN:1090
ADR:3,II
REACH:01-2119471330-49
:GHS02
:GHS07
:GHS08
사양
- Environmentally Preferable:Safer Human and Environmental Health
- Environmental certification:Chem21 Solvent Selection Guide recommended after discussion
사양
사양 테스트 결과
- For Microelectronic Use:= 99.5 %
- Assay ((CH₃)₂CO) (by GC, Corrected for Water):≥99.5%
- Colour (APHA):≤10
- Residue after Evaporation:≤5 ppm
- Titrable Acid (µeq/g):≤0.3
- Titrable Base (µeq/g):≤0.5
- Water (H₂O):≤0.5%
- Solubility in H₂O:Passes Test
- Chloride (Cl):≤0.2 ppm
- Phosphate (PO₄):≤0.05 ppm
- Trace Impurities - Aluminum (Al):≤50.0 ppb
- Arsenic and Antimony (as As):≤5.0 ppb
- Trace Impurities - Barium (Ba):≤20.0 ppb
- Trace Impurities - Beryllium (Be):≤10.0 ppb
- Trace Impurities - Bismuth (Bi):≤20.0 ppb
- Trace Impurities - Boron (B):≤10.0 ppb
- Trace Impurities - Cadmium (Cd):≤10.0 ppb
- Trace Impurities - Calcium (Ca):≤25.0 ppb
- Trace Impurities - Chromium (Cr):≤10.0 ppb
- Trace Impurities - Cobalt (Co):≤10.0 ppb
- Trace Impurities - Copper (Cu):≤10.0 ppb
- Trace Impurities - Gallium (Ga):≤10.0 ppb
- Trace Impurities - Germanium (Ge):≤10.0 ppb
- Trace Impurities - Gold (Au):≤20 ppb
- Trace Impurities - Iron (Fe):≤20.0 ppb
- Trace Impurities - Lead (Pb):≤10.0 ppb
- Trace Impurities - Lithium (Li):≤10.0 ppb
- Trace Impurities - Magnesium (Mg):≤20 ppb
- Trace Impurities - Manganese (Mn):≤10.0 ppb
- Trace Impurities - Molybdenum (Mo):≤10.0 ppb
- Trace Impurities - Nickel (Ni):≤10.0 ppb
- Trace Impurities - Niobium (Nb):≤50.0 ppb
- Trace Impurities - Potassium (K):≤10.0 ppb
- Trace Impurities - Silicon (Si):≤50 ppb
- Trace Impurities - Silver (Ag):≤10.0 ppb
- Trace Impurities - Sodium (Na):≤10.0 ppb
- Trace Impurities - Strontium (Sr):≤10.0 ppb
- Trace Impurities - Tantalum (Ta):≤50.0 ppb
- Trace Impurities - Thallium (Tl):≤10.0 ppb
- Trace Impurities - Tin (Sn):≤20.0 ppb
- Trace Impurities - Titanium (Ti):≤10.0 ppb
- Trace Impurities - Vanadium (V):≤10.0 ppb
- Trace Impurities - Zinc (Zn):≤20.0 ppb
- Trace Impurities - Zirconium (Zr):≤10.0 ppb
- Particle Count - 0.5 µm and Greater (Rion KS42AF):≤100 par/ml
- Particle Count - 1.0 µm and Greater (Rion KS42AF):≤8 par/ml
사양 테스트 결과
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