


Methanol VLSI for microelectronic, J.T.Baker®
5370-05
: Avantor
:
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- Pk:8 pt US
- Seq:8026
- For Microelectronic Use:= 99.9 %
- Assay (CH₃OH) (by GC):≥99.9 %
- Color (APHA):≤10
- Acidity (µeq/g):≤0.3
- Alkalinity (µeq/g):≤0.1
- Residue after Evaporation:≤5 ppm
- Water (H₂O)(by Karl Fischer titrn):≤0.05 %
- Solubility in H₂O:Passes Test
- Arsenic and Antimony (as As):≤10.0 ppb
- Chloride (Cl):≤0.2 ppm
- Heavy Metals (as Pb):≤100.0 ppb
- Phosphate (PO₄):≤0.3 ppm
- Trace Impurities - Aluminum (Al):≤50.0 ppb
- Trace Impurities - Barium (Ba):≤20.0 ppb
- Trace Impurities - Boron (B):≤10.0 ppb
- Trace Impurities - Cadmium (Cd):≤20.0 ppb
- Trace Impurities - Calcium (Ca):≤50.0 ppb
- Trace Impurities - Chromium (Cr):≤20.0 ppb
- Trace Impurities - Cobalt (Co):≤20 ppb
- Trace Impurities - Copper (Cu):≤10.0 ppb
- Trace Impurities - Gallium (Ga):≤50 ppb
- Trace Impurities - Germanium (Ge):≤50.0 ppb
- Trace Impurities - Gold (Au):≤20 ppb
- Trace Impurities - Iron (Fe):≤50.0 ppb
- Trace Impurities - Lead (Pb):≤50 ppb
- Trace Impurities - Lithium (Li):≤50.0 ppb
- Trace Impurities - Magnesium (Mg):≤50.0 ppb
- Trace Impurities - Manganese (Mn):≤10.0 ppb
- Trace Impurities - Nickel (Ni):≤10.0 ppb
- Trace Impurities - Potassium (K):≤50 ppb
- Trace Impurities - Silicon (Si):≤50 ppb
- Trace Impurities - Silver (Ag):≤20.0 ppb
- Trace Impurities - Sodium (Na):≤50.0 ppb
- Trace Impurities - Strontium (Sr):≤10.0 ppb
- Trace Impurities - Tin (Sn):≤50 ppb
- Trace Impurities - Titanium (Ti):≤20 ppb
- Trace Impurities - Zinc (Zn):≤50 ppb
- Particle Count - 0.5 µm and greater:≤50 par/ml
- Particle Count - 1.0 µm and greater:≤8 par/ml
:
:32.04 g/mol
:13,05984
:64.6 °C (1013 hPa)
:–98 °C
:0.7918 g/cm³ (20 °C)
:11 °C (closed cup)
:Ambient
:200-659-6
:1230
:3,II
:01-2119433307-44
:GHS02
:GHS06
:GHS08
:67-56-1
:CH₃OH
:MFCD00004595