


Buffered oxide etch (6:1), CMOS for microelectronic use, J.T.Baker®
Catalog # 1198-07
Supplier: Avantor
CAS Number:
Specifications
- Pk:46 lb
- Seq:7125
Specifications
Specification Test Results
- Ammonium Fluoride (NH₄F)(w/w):33.5 - 35.5 %
- Hydrofluoric Acid (HF)(w/w):7.0 - 7.3 %
- Residue after Ignition:≤ 10 ppm
- Chloride (Cl):≤ 3000.0 ppb
- Nitrate (NO₃):≤ 3000 ppb
- Phosphate (PO₄):≤ 700.0 ppb
- Sulfate (SO₄):≤ 1500.0 ppb
- Trace Impurities - Aluminum (Al):≤ 50.0 ppb
- Arsenic and Antimony (as As):≤ 30.0 ppb
- Trace Impurities - Barium (Ba):≤ 10.0 ppb
- Trace Impurities - Beryllium (Be):≤ 10.0 ppb
- Trace Impurities - Bismuth (Bi):≤ 20.0 ppb
- Trace Impurities - Boron (B):≤ 50 ppb
- Trace Impurities - Cadmium (Cd):≤ 20.0 ppb
- Trace Impurities - Calcium (Ca):≤ 100.0 ppb
- Trace Impurities - Chromium (Cr):≤ 10.0 ppb
- Trace Impurities - Cobalt (Co):≤ 10.0 ppb
- Trace Impurities - Copper (Cu):≤ 10.0 ppb
- Trace Impurities - Gallium (Ga):≤ 10.0 ppb
- Trace Impurities - Germanium (Ge):≤ 40.0 ppb
- Trace Impurities - Gold (Au):≤ 20 ppb
- Heavy Metals (as Pb):≤ 1000.0 ppb
- Trace Impurities - Iron (Fe):≤ 50.0 ppb
- Trace Impurities - Lead (Pb):≤ 10.0 ppb
- Trace Impurities - Lithium (Li):≤ 10.0 ppb
- Trace Impurities - Magnesium (Mg):≤ 50.0 ppb
- Trace Impurities - Manganese (Mn):≤ 10.0 ppb
- Trace Impurities - Molybdenum (Mo):≤ 10.0 ppb
- Trace Impurities - Nickel (Ni):≤ 10.0 ppb
- Trace Impurities - Potassium (K):≤ 50 ppb
- Trace Impurities - Silver (Ag):≤ 50 ppb
- Trace Impurities - Sodium (Na):≤ 100.0 ppb
- Trace Impurities - Strontium (Sr):≤ 10.0 ppb
- Trace Impurities - Thallium (Tl):≤ 20.0 ppb
- Trace Impurities - Tin (Sn):≤ 20.0 ppb
- Trace Impurities - Titanium (Ti):≤ 100.0 ppb
- Trace Impurities - Zinc (Zn):≤ 100.0 ppb
- Particle Count at point of fill - 0.5 µm and greater:≤ 150 par/ml
- Particle Count at point of fill - 1.0 µm and greater:≤ 50 par/ml
Specification Test Results
About this item
:
UN:2922
ADR:8,II
:GHS05
:GHS06
:GHS08
Storage Temperature:Ambient