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Ammonium fluoride 40% in aqueous solution, CMOS for microelectronic, J.T.Baker®
Toxic
Ammonium fluoride 40% in aqueous solution, CMOS for microelectronic, J.T.Baker®
Catalog # 0702-05
Supplier:  Avantor
CAS Number:  
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Toxic
Ammonium fluoride 40% in aqueous solution, CMOS for microelectronic, J.T.Baker®
Catalog # 0702-05
Supplier:  Avantor
CAS Number:  

Specifications

  • Pack type:
    Poly bottle, pressure bottom
  • Pk:
    7 lb
  • Seq:
    7068

Specifications

Specification Test Results

  • For Microelectronic Use:
    39.0 - 41.0 %
  • Assay (NH₄F):
    39.0 - 41.0 %
  • Color (APHA):
    ≤10
  • pH of 1% Solution at 25°C:
    6.0 - 7.5
  • Residue after Ignition:
    ≤5 ppm
  • Chloride (Cl):
    ≤2 ppm
  • Insoluble Matter:
    ≤0.5 ppm
  • Nitrate (NO₃):
    ≤5 ppm
  • Oxidizable Species (as SO₃):
    ≤1 ppm
  • Phosphate (PO₄):
    ≤0.20 ppm
  • Sulfate (SO₄):
    ≤1 ppm
  • Trace Impurities - Aluminum (Al):
    ≤50.0 ppb
  • Trace Impurities - Antimony (Sb):
    ≤10.0 ppb
  • Trace Impurities - Arsenic (As):
    ≤20.0 ppb
  • Arsenic and Antimony (as As):
    ≤30.0 ppb
  • Trace Impurities - Barium (Ba):
    ≤10.0 ppb
  • Trace Impurities - Beryllium (Be):
    ≤5.0 ppb
  • Trace Impurities - Bismuth (Bi):
    ≤50 ppb
  • Trace Impurities - Boron (B):
    ≤20.0 ppb
  • Trace Impurities - Cadmium (Cd):
    ≤20.0 ppb
  • Trace Impurities - Calcium (Ca):
    ≤10.0 ppb
  • Trace Impurities - Chromium (Cr):
    ≤10.0 ppb
  • Trace Impurities - Cobalt (Co):
    ≤10.0 ppb
  • Trace Impurities - Copper (Cu):
    ≤10.0 ppb
  • Trace Impurities - Gallium (Ga):
    ≤50 ppb
  • Trace Impurities - Germanium (Ge):
    ≤40.0 ppb
  • Trace Impurities - Gold (Au):
    ≤20 ppb
  • Heavy Metals (as Pb):
    ≤500.0 ppb
  • Trace Impurities - Iron (Fe):
    ≤50.0 ppb
  • Trace Impurities - Lead (Pb):
    ≤50 ppb
  • Trace Impurities - Lithium (Li):
    ≤10.0 ppb
  • Trace Impurities - Magnesium (Mg):
    ≤10.0 ppb
  • Trace Impurities - Manganese (Mn):
    ≤20.0 ppb
  • Trace Impurities - Molybdenum (Mo):
    ≤50.0 ppb
  • Trace Impurities - Nickel (Ni):
    ≤50 ppb
  • Trace Impurities - Niobium (Nb):
    ≤20.0 ppb
  • Trace Impurities - Potassium (K):
    ≤100 ppb
  • Trace Impurities - Silver (Ag):
    ≤10.0 ppb
  • Trace Impurities - Sodium (Na):
    ≤50.0 ppb
  • Trace Impurities - Strontium (Sr):
    ≤10.0 ppb
  • Trace Impurities - Tantalum (Ta):
    ≤50.0 ppb
  • Trace Impurities - Thallium (Tl):
    ≤20.0 ppb
  • Trace Impurities - Tin (Sn):
    ≤50 ppb
  • Trace Impurities - Titanium (Ti):
    ≤50.0 ppb
  • Trace Impurities - Vanadium (V):
    ≤10.0 ppb
  • Trace Impurities - Zinc (Zn):
    ≤20.0 ppb
  • Trace Impurities - Zirconium (Zr):
    ≤5.0 ppb
  • Particle Count - 0.5 µm and greater:
    ≤100 par/ml
  • Particle Count - 1.0 µm and greater:
    ≤25 par/ml

Specification Test Results

About this item

 :
 :37.04 g/mol
Storage Temperature:Ambient
EINECS:235-185-9
UN:3287
ADR:6.1,III
 :GHS06
CAS Number:12125-01-8
Formula:NH₄F
MDL Number:MFCD00011423