Methanol, CMOS for microelectronic, J.T.Baker®

Specifikationstestresultater

• Assay (CH₃OH) (by GC):
  ≥99.9 %
• Color (APHA):
  ≤10
• Acidity (µeq/g):
  ≤0.3
• Alkalinity (µeq/g):
  ≤0.1
• Residue after Evaporation:
  ≤5 ppm
• Water (H₂O)(by Karl Fischer titrn):
  ≤0.05 %
• Solubility in H₂O:
  Passes Test
• Chloride (Cl):
  ≤0.2 ppm
• Heavy Metals (as Pb):
  ≤100.0 ppb
• Phosphate (PO₄):
  ≤0.3 ppm
• Sulfate (SO₄):
  ≤0.5 ppm
• Trace Impurities - Aluminum (Al):
  ≤50.0 ppb
• Trace Impurities - Arsenic (As):
  ≤5.0 ppb
• Trace Impurities - Antimony (Sb):
  ≤5.0 ppb
• Trace Impurities - Barium (Ba):
  ≤20.0 ppb
• Trace Impurities - Boron (B):
  ≤10.0 ppb
• Trace Impurities - Cadmium (Cd):
  ≤20.0 ppb
• Trace Impurities - Calcium (Ca):
  ≤50.0 ppb
• Trace Impurities - Chromium (Cr):
  ≤20.0 ppb
• Trace Impurities - Cobalt (Co):
  ≤20 ppb
• Trace Impurities - Copper (Cu):
  ≤10.0 ppb
• Trace Impurities - Gallium (Ga):
  ≤50 ppb
• Trace Impurities - Germanium (Ge):
  ≤50.0 ppb
• Trace Impurities - Gold (Au):
  ≤20 ppb
• Trace Impurities - Iron (Fe):
  ≤50.0 ppb
• Trace Impurities - Lead (Pb):
  ≤50 ppb
• Trace Impurities - Lithium (Li):
  ≤50.0 ppb
• Trace Impurities - Magnesium (Mg):
  ≤50.0 ppb
• Trace Impurities - Manganese (Mn):
  ≤10.0 ppb
• Trace Impurities - Molybdenum (Mo):
  ≤300.0 ppb
• Trace Impurities - Nickel (Ni):
  ≤10.0 ppb
• Trace Impurities - Potassium (K):
  ≤50 ppb
• Trace Impurities - Silicon (Si):
  ≤50 ppb
• Trace Impurities - Silver (Ag):
  ≤20.0 ppb
• Trace Impurities - Sodium (Na):
  ≤50.0 ppb
• Trace Impurities - Strontium (Sr):
  ≤10.0 ppb
• Trace Impurities - Tin (Sn):
  ≤50 ppb
• Trace Impurities - Titanium (Ti):
  ≤20 ppb
• Trace Impurities - Vanadium (V):
  ≤300.0 ppb
• Trace Impurities - Zinc (Zn):
  ≤50 ppb
• Trace Impurities - Zirconium (Zr):
  ≤300.0 ppb
• Particle Count at point of fill - 0.5 µm and greater:
  ≤250 par/ml
• Particle Count at point of fill - 1.0 µm and greater:
  ≤25 par/ml