Toluene ≥99.5% (by GC), CMOS for microelectronic, J.T.Baker®
Catalog # 9476-09
Supplier: Avantor
CAS Number:
Specifications
- Pk:390 lb
- Seq:7281
- Environmentally Preferable:
Specifications
Specification Test Results
- For Microelectronic Use:= 99.5 %
- Assay (C₆H₅CH₃) (by GC):≥99.5 %
- Color (APHA):≤10
- Acidity (µeq/g):≤0.2
- Residue after Evaporation:≤2.0 ppm
- Water (by KF, coulometric):≤0.03 %
- Substances Darkened by H₂SO₄:Passes Test
- Sulfur Compounds (as S):≤0.003 %
- Chloride (Cl):≤2 ppm
- Phosphate (PO₄):≤0.5 ppm
- Trace Impurities - Aluminum (Al):≤20 ppb
- Arsenic and Antimony (as As):≤10.0 ppb
- Trace Impurities - Barium (Ba):≤10.0 ppb
- Trace Impurities - Boron (B):≤20.0 ppb
- Trace Impurities - Cadmium (Cd):≤20.0 ppb
- Trace Impurities - Calcium (Ca):≤100.0 ppb
- Trace Impurities - Chromium (Cr):≤10.0 ppb
- Trace Impurities - Cobalt (Co):≤20 ppb
- Trace Impurities - Copper (Cu):≤20.0 ppb
- Trace Impurities - Gallium (Ga):≤50 ppb
- Trace Impurities - Germanium (Ge):≤50.0 ppb
- Trace Impurities - Gold (Au):≤20 ppb
- Heavy Metals (as Pb):≤500.0 ppb
- Trace Impurities - Iron (Fe):≤20.0 ppb
- Trace Impurities - Lithium (Li):≤20.0 ppb
- Trace Impurities - Magnesium (Mg):≤10.0 ppb
- Trace Impurities - Manganese (Mn):≤10.0 ppb
- Trace Impurities - Nickel (Ni):≤20.0 ppb
- Trace Impurities - Potassium (K):≤50 ppb
- Trace Impurities - Silicon (Si):≤100.0 ppb
- Trace Impurities - Silver (Ag):≤20.0 ppb
- Trace Impurities - Sodium (Na):≤100.0 ppb
- Trace Impurities - Strontium (Sr):≤10.0 ppb
- Trace Impurities - Tin (Sn):≤30.0 ppb
- Trace Impurities - Zinc (Zn):≤20.0 ppb
Specification Test Results
About this item
Synonyms: Methylbenzene, Phenylmethane, FM approval
:
:92.14 g/mol
Merck Index:13,09607
Boiling Pt:110.6 °C (1013 hPa)
Melting Pt:–95 °C
Density:0.867 g/cm³ (20 °C)
Flash Pt:4 °C
Storage Temperature:Ambient
EINECS:203-625-9
UN:1294
ADR:3,II
REACH:05-2114615130-69
:GHS02
:GHS08
:GHS07
CAS Number:108-88-3
Formula:C₆H₅CH₃
MDL Number:MFCD00008512