
Sulphuric acid ≥96%, CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
Certificates
About this item
CAS Number:7664-93-9
:
Formula:H₂SO₄
MDL Number:MFCD00064589
:98.08 g/mol
Merck Index:14,08974
Boiling Pt:∼335 °C (1013 hPa)
Melting Pt:3 °C
Density:1.84 g/cm³ (20 °C)
Storage Temperature:Ambient
EINECS:231-639-5
UN:1830
ADR:8,II
:GHS05
Some Products May Appear Restricted
To ensure a smooth and speedy checkout, please log in to your account. Some items may show as restricted simply because you're not logged in.
If you do not have an account, you can register using our registration webform (https://www.avantorsciences.com/us/en/login/register)
If you're still seeing restrictions after logging in, certain products—like chemicals or medical devices—require additional account verification steps to be able to place an order. Some items may additionally require a specific license or customer documentation; additional documentation will be requested for these items prior to shipment.
Specification Test Results
- For Microelectronic Use:95.0 - 97.0 %
- Recommended Storage Conditions: 15° - 100°F:= 10
- Assay (H₂SO₄):95.0 - 97.0 %
- Color (APHA):≤10
- Residue after Ignition:≤2 ppm
- Chloride (Cl):≤0.1 ppm
- Nitrate (NO₃):≤0.2 ppm
- Phosphate (PO₄):≤0.3 ppm
- Trace Impurities - Aluminum (Al):≤50.0 ppb
- Arsenic and Antimony (as As):≤5.0 ppb
- Trace Impurities - Barium (Ba):≤10.0 ppb
- Trace Impurities - Beryllium (Be):≤10.0 ppb
- Trace Impurities - Bismuth (Bi):≤20.0 ppb
- Trace Impurities - Boron (B):≤10.0 ppb
- Trace Impurities - Cadmium (Cd):≤10.0 ppb
- Trace Impurities - Calcium (Ca):≤50.0 ppb
- Trace Impurities - Chromium (Cr):≤50 ppb
- Trace Impurities - Cobalt (Co):≤10.0 ppb
- Trace Impurities - Copper (Cu):≤10.0 ppb
- Trace Impurities - Gallium (Ga):≤10.0 ppb
- Trace Impurities - Germanium (Ge):≤10.0 ppb
- Trace Impurities - Gold (Au):≤20 ppb
- Heavy Metals (as Pb):≤200.0 ppb
- Trace Impurities - Iron (Fe):≤100.0 ppb
- Trace Impurities - Lead (Pb):≤20.0 ppb
- Trace Impurities - Lithium (Li):≤10.0 ppb
- Trace Impurities - Magnesium (Mg):≤50.0 ppb
- Trace Impurities - Manganese (Mn):≤10.0 ppb
- Trace Impurities - Mercury (Hg):≤5.0 ppb
- Trace Impurities - Molybdenum (Mo):≤10.0 ppb
- Trace Impurities - Nickel (Ni):≤10.0 ppb
- Trace Impurities - Niobium (Nb):≤10.0 ppb
- Trace Impurities - Potassium (K):≤50 ppb
- Trace Impurities - Silicon (Si):≤50 ppb
- Trace Impurities - Silver (Ag):≤10.0 ppb
- Trace Impurities - Sodium (Na):≤100.0 ppb
- Trace Impurities - Strontium (Sr):≤10.0 ppb
- Trace Impurities - Tantalum (Ta):≤10.0 ppb
- Trace Impurities - Thallium (Tl):≤20.0 ppb
- Trace Impurities - Tin (Sn):≤50 ppb
- Trace Impurities - Titanium (Ti):≤10.0 ppb
- Trace Impurities - Vanadium (V):≤10.0 ppb
- Trace Impurities - Zinc (Zn):≤50 ppb
- Trace Impurities - Zirconium (Zr):≤10.0 ppb
- Particle Count - 0.5 µm and greater:≤60 par/ml
- Particle Count - 1.0 µm and greater:≤10 par/ml
Specification Test Results
Related Information
Frequently Bought Together