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Hydrochloric acid 37.0 - 38.0%, CMOS for microelectronic, J.T.Baker®
Corrosive
Irritant
Hydrochloric acid 37.0 - 38.0%, CMOS for microelectronic, J.T.Baker®
Supplier:  Avantor
Certificatesundefined
Corrosive
Irritant
Hydrochloric acid 37.0 - 38.0%, CMOS for microelectronic, J.T.Baker®
Supplier:  Avantor
Certificates

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Specification Test Results

  • For Microelectronic Use:
    37.0 - 38.0 %
  • Store below 25°C:
    = 10
  • Assay (as HCl) (by acid-base titrn):
    37.0 - 38.0 %
  • Color (APHA):
    ≤ 10
  • Residue after Ignition:
    ≤ 3 ppm
  • Extractable Organic Substances:
    ≤ 3 ppm
  • Bromide (Br):
    ≤ 0.005 %
  • Free Halogen (as Cl₂):
    Passes Test
  • Ammonium (NH₄):
    ≤ 1 ppm
  • Phosphate (PO₄):
    ≤ 0.05 ppm
  • Sulfate (SO₄):
    ≤ 0.3 ppm
  • Sulfite (SO₃):
    ≤ 0.8 ppm
  • Trace Impurities - Aluminum (Al):
    ≤ 50.0 ppb
  • Arsenic and Antimony (as As):
    ≤ 5.0 ppb
  • Trace Impurities - Barium (Ba):
    ≤ 20.0 ppb
  • Trace Impurities - Beryllium (Be):
    ≤ 10.0 ppb
  • Trace Impurities - Bismuth (Bi):
    ≤ 20.0 ppb
  • Trace Impurities - Boron (B):
    ≤ 20.0 ppb
  • Trace Impurities - Cadmium (Cd):
    ≤ 5.0 ppb
  • Trace Impurities - Calcium (Ca):
    ≤ 100.0 ppb
  • Trace Impurities - Chromium (Cr):
    ≤ 10.0 ppb
  • Trace Impurities - Cobalt (Co):
    ≤ 5.0 ppb
  • Trace Impurities - Copper (Cu):
    ≤ 5.0 ppb
  • Trace Impurities - Gallium (Ga):
    ≤ 20.0 ppb
  • Trace Impurities - Germanium (Ge):
    ≤ 20 ppb
  • Trace Impurities - Gold (Au):
    ≤ 20 ppb
  • Heavy Metals (as Pb):
    ≤ 100 ppb
  • Trace Impurities - Iron (Fe):
    ≤ 50.0 ppb
  • Trace Impurities - Lead (Pb):
    ≤ 20.0 ppb
  • Trace Impurities - Lithium (Li):
    ≤ 20.0 ppb
  • Trace Impurities - Magnesium (Mg):
    ≤ 50.0 ppb
  • Trace Impurities - Manganese (Mn):
    ≤ 5.0 ppb
  • Trace Impurities - Molybdenum (Mo):
    ≤ 10.0 ppb
  • Trace Impurities - Nickel (Ni):
    ≤ 10.0 ppb
  • Trace Impurities - Niobium (Nb):
    ≤ 10.0 ppb
  • Trace Impurities - Potassium (K):
    ≤ 50 ppb
  • Trace Impurities - Silicon (Si):
    ≤ 100.0 ppb
  • Trace Impurities - Silver (Ag):
    ≤ 20.0 ppb
  • Trace Impurities - Sodium (Na):
    ≤ 100.0 ppb
  • Trace Impurities - Strontium (Sr):
    ≤ 20.0 ppb
  • Trace Impurities - Tantalum (Ta):
    ≤ 10.0 ppb
  • Trace Impurities - Thallium (Tl):
    ≤ 20.0 ppb
  • Trace Impurities - Tin (Sn):
    ≤ 50 ppb
  • Trace Impurities - Titanium (Ti):
    ≤ 10.0 ppb
  • Trace Impurities - Vanadium (V):
    ≤ 10.0 ppb
  • Trace Impurities - Zinc (Zn):
    ≤ 30.0 ppb
  • Trace Impurities - Zirconium (Zr):
    ≤ 10.0 ppb
  • Particle Count - 0.5 µm and greater:
    ≤ 50 par/ml
  • Particle Count - 1.0 µm and greater:
    ≤ 10 par/ml

Specification Test Results

Related Information