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Acetone, CMOS for microelectronic, J.T.Baker®

330 lb
  9015-09
 
 
 :   Avantor
Acetone, CMOS for microelectronic, J.T.Baker®
  9015-09
 :  Avantor
 :  67-64-1
Acetone, CMOS for microelectronic, J.T.Baker®
Acetone, CMOS for microelectronic, J.T.Baker®

330 lb

 :  67-64-1
 
 
   
1 * 330 lb
 
 :  2-Propanone, DMK, Propanone, Dimethyl ketone
  •  :67-64-1
  •  :CH₃COCH₃
  •  :MFCD00008765
  •  :58.08 g/mol
  •  :13,00067
  •  :56,2 °C (1013 hPa)
  •  :–95,4 °C
  •  :0,792 g/cm³ (20 °C)
  •  :<–20 °C (coppa chiusa)
  •  :Ambiente
  •  :200-662-2
  •  :1090
  •  :3,II
  •  :01-2119471330-49
 

 

  • For Microelectronic Use:
    = 99.5 %
  • Assay ((CH₃)₂CO) (by GC, corrected for water):
    ≥ 99.5 %
  • Color (APHA):
    ≤ 10
  • Residue after Evaporation:
    ≤ 5 ppm
  • Titrable Acid (µeq/g):
    ≤ 0.3
  • Titrable Base (µeq/g):
    ≤ 0.5
  • Water (H₂O):
    ≤ 0.5 %
  • Solubility in H₂O:
    Passes Test
  • Chloride (Cl):
    ≤ 0.2 ppm
  • Phosphate (PO₄):
    ≤ 0.05 ppm
  • Trace Impurities - Aluminum (Al):
    ≤ 50.0 ppb
  • Arsenic and Antimony (as As):
    ≤ 5.0 ppb
  • Trace Impurities - Barium (Ba):
    ≤ 20.0 ppb
  • Trace Impurities - Beryllium (Be):
    ≤ 10.0 ppb
  • Trace Impurities - Bismuth (Bi):
    ≤ 20.0 ppb
  • Trace Impurities - Boron (B):
    ≤ 10.0 ppb
  • Trace Impurities - Cadmium (Cd):
    ≤ 10.0 ppb
  • Trace Impurities - Calcium (Ca):
    ≤ 25.0 ppb
  • Trace Impurities - Chromium (Cr):
    ≤ 10.0 ppb
  • Trace Impurities - Cobalt (Co):
    ≤ 10.0 ppb
  • Trace Impurities - Copper (Cu):
    ≤ 10.0 ppb
  • Trace Impurities - Gallium (Ga):
    ≤ 10.0 ppb
  • Trace Impurities - Germanium (Ge):
    ≤ 10.0 ppb
  • Trace Impurities - Gold (Au):
    ≤ 20 ppb
  • Trace Impurities - Iron (Fe):
    ≤ 20.0 ppb
  • Trace Impurities - Lead (Pb):
    ≤ 10.0 ppb
  • Trace Impurities - Lithium (Li):
    ≤ 10.0 ppb
  • Trace Impurities - Magnesium (Mg):
    ≤ 20 ppb
  • Trace Impurities - Manganese (Mn):
    ≤ 10.0 ppb
  • Trace Impurities - Molybdenum (Mo):
    ≤ 10.0 ppb
  • Trace Impurities - Nickel (Ni):
    ≤ 10.0 ppb
  • Trace Impurities - Niobium (Nb):
    ≤ 50.0 ppb
  • Trace Impurities - Potassium (K):
    ≤ 10.0 ppb
  • Trace Impurities - Silicon (Si):
    ≤ 50 ppb
  • Trace Impurities - Silver (Ag):
    ≤ 10.0 ppb
  • Trace Impurities - Sodium (Na):
    ≤ 10.0 ppb
  • Trace Impurities - Strontium (Sr):
    ≤ 10.0 ppb
  • Trace Impurities - Tantalum (Ta):
    ≤ 50.0 ppb
  • Trace Impurities - Thallium (Tl):
    ≤ 10.0 ppb
  • Trace Impurities - Tin (Sn):
    ≤ 20.0 ppb
  • Trace Impurities - Titanium (Ti):
    ≤ 10.0 ppb
  • Trace Impurities - Vanadium (V):
    ≤ 10.0 ppb
  • Trace Impurities - Zinc (Zn):
    ≤ 20.0 ppb
  • Trace Impurities - Zirconium (Zr):
    ≤ 10.0 ppb
  • Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF or equivalent):
    ≤ 150 par/ml
  • Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF or equivalent):
    ≤ 25 par/ml

 

  • Conf:
    330 lb