Acetone, CMOS for microelectronic, J.T.Baker®

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Nome del fornitore: Avantor

Acetone, CMOS for microelectronic, J.T.Baker®

Nome del fornitore: Avantor

Certificates

Acetone, CMOS for microelectronic, J.T.Baker®

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Specifications for Product Family Product Family Options

Informazioni su questo articolo

Sinonimi: 2-Propanone, DMK, Propanone, Dimethyl ketone

Numero CAS:67-64-1
Formula:CH₃COCH₃
Numero MDL:MFCD00008765
Molecular Weight:58.08 g/mol
IndexMerck:13,00067
Punto di ebollizione:56,2 °C (1013 hPa)
Punto di fusione:–95,4 °C
Densità:0,792 g/cm³ (20 °C)
Punto di infiammabilità:<–20 °C (coppa chiusa)
temperatura di conservazione:Ambiente
EINECS:200-662-2
UN:1090
ADR:3,II
REACH:01-2119471330-49

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Product Details & Documents

Sinonimi: 2-Propanone, DMK, Propanone, Dimethyl ketone

Numero CAS:67-64-1
Formula:CH₃COCH₃
Numero MDL:MFCD00008765
Molecular Weight:58.08 g/mol
IndexMerck:13,00067
Punto di ebollizione:56,2 °C (1013 hPa)
Punto di fusione:–95,4 °C
Densità:0,792 g/cm³ (20 °C)
Punto di infiammabilità:<–20 °C (coppa chiusa)
temperatura di conservazione:Ambiente
EINECS:200-662-2
UN:1090
ADR:3,II
REACH:01-2119471330-49

Certificates

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SDS_IT_CH_BAKR9015

spec_BAKR9015-2J

Specifications for Product Family

Risultati dei test sulle specifiche

For Microelectronic Use:
= 99.5 %
Assay ((CH₃)₂CO) (by GC, corrected for water):
≥ 99.5 %
Color (APHA):
≤ 10
Residue after Evaporation:
≤ 5 ppm
Titrable Acid (µeq/g):
≤ 0.3
Titrable Base (µeq/g):
≤ 0.5
Water (H₂O):
≤ 0.5 %
Solubility in H₂O:
Passes Test
Chloride (Cl):
≤ 0.2 ppm
Phosphate (PO₄):
≤ 0.05 ppm
Trace Impurities - Aluminum (Al):
≤ 50.0 ppb
Arsenic and Antimony (as As):
≤ 5.0 ppb
Trace Impurities - Barium (Ba):
≤ 20.0 ppb
Trace Impurities - Beryllium (Be):
≤ 10.0 ppb
Trace Impurities - Bismuth (Bi):
≤ 20.0 ppb
Trace Impurities - Boron (B):
≤ 10.0 ppb
Trace Impurities - Cadmium (Cd):
≤ 10.0 ppb
Trace Impurities - Calcium (Ca):
≤ 25.0 ppb
Trace Impurities - Chromium (Cr):
≤ 10.0 ppb
Trace Impurities - Cobalt (Co):
≤ 10.0 ppb
Trace Impurities - Copper (Cu):
≤ 10.0 ppb
Trace Impurities - Gallium (Ga):
≤ 10.0 ppb
Trace Impurities - Germanium (Ge):
≤ 10.0 ppb
Trace Impurities - Gold (Au):
≤ 20 ppb
Trace Impurities - Iron (Fe):
≤ 20.0 ppb
Trace Impurities - Lead (Pb):
≤ 10.0 ppb
Trace Impurities - Lithium (Li):
≤ 10.0 ppb
Trace Impurities - Magnesium (Mg):
≤ 20 ppb
Trace Impurities - Manganese (Mn):
≤ 10.0 ppb
Trace Impurities - Molybdenum (Mo):
≤ 10.0 ppb
Trace Impurities - Nickel (Ni):
≤ 10.0 ppb
Trace Impurities - Niobium (Nb):
≤ 50.0 ppb
Trace Impurities - Potassium (K):
≤ 10.0 ppb
Trace Impurities - Silicon (Si):
≤ 50 ppb
Trace Impurities - Silver (Ag):
≤ 10.0 ppb
Trace Impurities - Sodium (Na):
≤ 10.0 ppb
Trace Impurities - Strontium (Sr):
≤ 10.0 ppb
Trace Impurities - Tantalum (Ta):
≤ 50.0 ppb
Trace Impurities - Thallium (Tl):
≤ 10.0 ppb
Trace Impurities - Tin (Sn):
≤ 20.0 ppb
Trace Impurities - Titanium (Ti):
≤ 10.0 ppb
Trace Impurities - Vanadium (V):
≤ 10.0 ppb
Trace Impurities - Zinc (Zn):
≤ 20.0 ppb
Trace Impurities - Zirconium (Zr):
≤ 10.0 ppb
Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF or equivalent):
≤ 150 par/ml
Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF or equivalent):
≤ 25 par/ml