Technische Daten

VE:
500 lb
Seq:
7323
Environmentally Preferable:

Technische Daten

Ergebnisse des Spezifikationstests

Assay (H₂O₂):
30.0 - 32.0 %
Color (APHA):
≤ 6
Free Acid (µeq/g):
≤ 0.6
Residue after Evaporation:
≤ 5 ppm
Chloride (Cl):
≤ 0.06 ppm
Nitrate (NO₃):
≤ 0.4 ppm
Phosphate (PO₄):
≤ 0.20 ppm
Sulfate (SO₄):
≤ 0.2 ppm
Trace Impurities - Aluminum (Al):
≤ 10.0 ppb
Arsenic and Antimony (as As):
≤ 5.0 ppb
Trace Impurities - Barium (Ba):
≤ 10.0 ppb
Trace Impurities - Beryllium (Be):
≤ 10.0 ppb
Trace Impurities - Bismuth (Bi):
≤ 10.0 ppb
Trace Impurities - Boron (B):
≤ 10.0 ppb
Trace Impurities - Cadmium (Cd):
≤ 10.0 ppb
Trace Impurities - Calcium (Ca):
≤ 10.0 ppb
Trace Impurities - Chromium (Cr):
≤ 10.0 ppb
Trace Impurities - Cobalt (Co):
≤ 10.0 ppb
Trace Impurities - Copper (Cu):
≤ 10.0 ppb
Trace Impurities - Gallium (Ga):
≤ 10.0 ppb
Trace Impurities - Germanium (Ge):
≤ 10.0 ppb
Trace Impurities - Gold (Au):
≤ 10.0 ppb
Trace Impurities - Iron (Fe):
≤ 10.0 ppb
Trace Impurities - Lead (Pb):
≤ 10.0 ppb
Trace Impurities - Lithium (Li):
≤ 10.0 ppb
Trace Impurities - Magnesium (Mg):
≤ 10.0 ppb
Trace Impurities - Manganese (Mn):
≤ 10.0 ppb
Trace Impurities - Molybdenum (Mo):
≤ 10.0 ppb
Trace Impurities - Nickel (Ni):
≤ 10.0 ppb
Trace Impurities - Niobium (Nb):
≤ 10.0 ppb
Trace Impurities - Potassium (K):
≤ 10.0 ppb
Trace Impurities - Silicon (Si):
≤ 10.0 ppb
Trace Impurities - Silver (Ag):
≤ 10.0 ppb
Trace Impurities - Sodium (Na):
≤ 10.0 ppb
Trace Impurities - Strontium (Sr):
≤ 10.0 ppb
Trace Impurities - Tantalum (Ta):
≤ 10.0 ppb
Trace Impurities - Thallium (Tl):
≤ 10.0 ppb
Trace Impurities - Tin (Sn):
≤ 10.0 ppb
Trace Impurities - Titanium (Ti):
≤ 10.0 ppb
Trace Impurities - Vanadium (V):
≤ 10.0 ppb
Trace Impurities - Zinc (Zn):
≤ 10.0 ppb
Trace Impurities - Zirconium (Zr):
≤ 10.0 ppb
Particle Count - 0.2 µm and greater:
≤ 1175 par/ml
Particle Count at point of fill - 0.5 µm and greater:
≤ 150 par/ml

Ergebnisse des Spezifikationstests

Über diesen Artikel

:34.01 g/mol

UN:2014

CAS-Nummer:7722-84-1

Formel:H₂O₂

MDL-Nummer:MFCD00011333

Siedepunkt:150.2

Schmelzender Platingehalt:-0.41

Dichte:1.11

ADR:5.1 II

Merck-Index:14,04798

:Veränderungsmanagement-Kategorie= R