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Hydrogen peroxide 30% stabilized, CMOS for the electronics industry, J.T.Baker®
Oxidizing
Corrosive
Toxic
Health
Hydrogen peroxide 30% stabilized, CMOS for the electronics industry, J.T.Baker®
MOC:  Regulated
Certificates
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Oxidizing
Corrosive
Toxic
Health
Hydrogen peroxide 30% stabilized, CMOS for the electronics industry, J.T.Baker®
MOC:  Regulated
Certificates

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Specification Test Results

  • Assay (H₂O₂):
    30.0 - 32.0 %
  • Color (APHA):
    ≤ 10
  • Free Acid (µeq/g):
    ≤ 0.2
  • Residue after Evaporation:
    ≤ 10 ppm
  • Ammonium (NH₄):
    ≤ 3 ppm
  • Chloride (Cl):
    ≤ 0.2 ppm
  • Nitrate (NO₃):
    ≤ 2 ppm
  • Phosphate (PO₄):
    ≤ 1 ppm
  • Sulfate (SO₄):
    ≤ 3 ppm
  • Trace Impurities - Aluminum (Al):
    ≤ 70.0 ppb
  • Trace Impurities - Antimony (Sb):
    ≤ 10.0 ppb
  • Trace Impurities - Arsenic (As):
    ≤ 10.0 ppb
  • Arsenic and Antimony (as As):
    ≤ 10.0 ppb
  • Trace Impurities - Barium (Ba):
    ≤ 20.0 ppb
  • Trace Impurities - Beryllium (Be):
    ≤ 10.0 ppb
  • Trace Impurities - Bismuth (Bi):
    ≤ 20.0 ppb
  • Trace Impurities - Boron (B):
    ≤ 10.0 ppb
  • Trace Impurities - Cadmium (Cd):
    ≤ 10.0 ppb
  • Trace Impurities - Calcium (Ca):
    ≤ 50.0 ppb
  • Trace Impurities - Chromium (Cr):
    ≤ 20.0 ppb
  • Trace Impurities - Cobalt (Co):
    ≤ 10.0 ppb
  • Trace Impurities - Copper (Cu):
    ≤ 10.0 ppb
  • Trace Impurities - Gallium (Ga):
    ≤ 20.0 ppb
  • Trace Impurities - Germanium (Ge):
    ≤ 10.0 ppb
  • Trace Impurities - Gold (Au):
    ≤ 10.0 ppb
  • Heavy Metals (as Pb):
    ≤ 500.0 ppb
  • Trace Impurities - Iron (Fe):
    ≤ 50.0 ppb
  • Trace Impurities - Lead (Pb):
    ≤ 10.0 ppb
  • Trace Impurities - Lithium (Li):
    ≤ 10.0 ppb
  • Trace Impurities - Magnesium (Mg):
    ≤ 10.0 ppb
  • Trace Impurities - Manganese (Mn):
    ≤ 10.0 ppb
  • Trace Impurities - Molybdenum (Mo):
    ≤ 10.0 ppb
  • Trace Impurities - Nickel (Ni):
    ≤ 10.0 ppb
  • Trace Impurities - Niobium (Nb):
    ≤ 10.0 ppb
  • Trace Impurities - Potassium (K):
    ≤ 600.0 ppb
  • Trace Impurities - Silicon (Si):
    ≤ 100.0 ppb
  • Trace Impurities - Silver (Ag):
    ≤ 10.0 ppb
  • Trace Impurities - Sodium (Na):
    ≤ 100.0 ppb
  • Trace Impurities - Strontium (Sr):
    ≤ 10.0 ppb
  • Trace Impurities - Tantalum (Ta):
    ≤ 10.0 ppb
  • Trace Impurities - Thallium (Tl):
    ≤ 50.0 ppb
  • Trace Impurities - Tin (Sn):
    190.0 - 500.0 ppb
  • Trace Impurities - Titanium (Ti):
    ≤ 10.0 ppb
  • Trace Impurities - Vanadium (V):
    ≤ 10.0 ppb
  • Particle Count - 0.2 µm and greater:
    ≤ 1175 par/ml
  • Trace Impurities - Zinc (Zn):
    ≤ 50 ppb
  • Trace Impurities - Zirconium (Zr):
    ≤ 10.0 ppb
  • Particle Count at point of fill - 0.5 µm and greater:
    ≤ 100 par/ml

Specification Test Results

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