Medium Resolution - Aluminum-Tungsten Dendrites, Electron Microscopy Sciences
Product Details & Documents
SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of gray levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximize visibility of edges. High resolution images ideally should show fine detail together with a lack of noise evidenced by a good range of gray levels.
The various spacings created by the dendritic structure give the gap test, and the topographical arrangement of the dendrites leads to the gray level test.
- Non-magnetic
- Vacuum clean
It is most useful for working in the probe size range of 25 to 75 nm.
Delivery information: Supplied unmounted.
Specifications
- Description:SEM Aluminum Tungsten Dendrites
Some Products May Appear Restricted
To ensure a smooth and speedy checkout, please log in to your account. Some items may show as restricted simply because you're not logged in.
If you do not have an account, you can register using our registration webform (https://www.avantorsciences.com/ca/en/login/register)
If you're still seeing restrictions after logging in, certain products—like chemicals or medical devices—require additional account verification steps to be able to place an order. Some items may additionally require a specific license or customer documentation; additional documentation will be requested for these items prior to shipment.
Recommendations will be personalized based on your shopping preferences only if you have given your consent by enabling "Enhance my Shopping Experience" on the "Personal Info page".
Otherwise, you will receive generic recommendations.
Catalog #: CA21905-026
Supplier: Kimberly-Clark