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- Description:SEM Aluminum Tungsten Dendrites
- Cat. no.:100494-972
- Supplier No.:79514-01
SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of gray levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximize visibility of edges. High resolution images ideally should show fine detail together with a lack of noise evidenced by a good range of gray levels.
The various spacings created by the dendritic structure give the gap test, and the topographical arrangement of the dendrites leads to the gray level test.
- Non-magnetic
- Vacuum clean
It is most useful for working in the probe size range of 25 to 75 nm.