Colour Reference and Spectroscopy Standards

Supplier: Electron Microscopy Sciences

Reflected light calibration slide with 0.1" length scale subdivided into 0.001" divisions.

Supplier: Electron Microscopy Sciences

The X-Checker™ was the first and remains the only complete calibration aid for SEM/EDS Systems.

Supplier: FIREFLYSCI, INC.

Wavelength accuracy is determined by scanning a wavelength filter with sharp, clearly defined transmission peaks and comparing the results to those on the certificate of calibration provided

Supplier: FIREFLYSCI, INC.

FireflySci's equivalent of the NIST SRM 930e calibration reference kit for testing photometric accuracy in the VIS range (400 to 700 nm). This kit comes with Firefly's Lifetime Warranty and never requires recalibration.

Supplier: Electron Microscopy Sciences

Standards Co (Cobalt) is compulsory for checking energy dispersive analyzers.

Supplier: FIREFLYSCI, INC.

Firefly’s FUV Dual Series filters allow you to verify photometric accuracy and stray light in the range of 200 - 700 nm. Includes certified values for both the front and back of the filter for determining stray light.

Supplier: Electron Microscopy Sciences

All standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: Electron Microscopy Sciences

MAC X-ray Microanalysis standards are supplied as 33 m (¹/₄") diameter pressed pellets or metal foils, and are prepared from selected high purity elements and compounds to ensure interference free-spectra. They are suitable for use by experienced spectroscopists as well as staff training.

Supplier: Ricca Chemical

Glass bottle, amber

Supplier: Electron Microscopy Sciences

MAC has developed multi-element blocks of reference materials suitable for the compilation of a reference library of Auger sensitivity factors when used with the Auger Electron Microscopy (AES). (Auger electron: one of the electrons ejected from an atom as a result of the internal conversion of its own X-ray in the auger effect. Auger effect: a process in which an atom singly ionized by emitting one electron with energy in the X-ray range instead of emitting the usual X-ray photon on recovery undergoes a transition in which a second electron is emitted).

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: Electron Microscopy Sciences

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems

Supplier: ELECTRON MICROSCOPY SCIENCE

All MAC X-ray Microanalysis standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems.

Supplier: Electron Microscopy Sciences

The TEM Checker contains 5 manganese discs in a standard grid storage box. The discs are not transparent to the beam but gives a strong manganese peak to check the resolution of EDS detector.

Supplier: FIREFLYSCI, INC.

Firefly's FUV neutral density solid-state filter series tests photometric accuracy in the UV and VIS range from 200-700nm. Our solid-state nano-deposition technology produces unparalleled stability and means that you will never need to recalibrate this filter.